TY  - JOUR

T1  - Metal-induced trap states: the roles of interface and border traps in HfO2/InGaAs

JO  - Micromachines

UR  - https://eprints.whiterose.ac.uk/id/eprint/203251

PY  - 2023/08/15

AU  - Do H-B

AU  - Luc Q-H

AU  - Pham PV

AU  - Phan-Gia A-V

AU  - Nguyen T-S

AU  - Le H-M

AU  - De Souza MM

ED  - 

DO  - DOI: 10.3390/mi14081606

PB  - MDPI AG

VL  - 14

IS  - 8

Y2  - 2025/12/07

ER  -