@inproceedings{inproceedings, title  = {{Surveying the Developer Experience of Flaky Tests}},

 publisher = {{IEEE}},

 url = {{https://doi.org/10.1109/icse-seip55303.2022.9793965 }},

 year = {{2023}},

 month = {{9}},

 author = {{Parry O and Kapfhammer GM and Hilton M and McMinn P}},

 doi = {{10.1109/icse-seip55303.2022.9793965}},

 journal = {{2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)}},

 pages = {{253-262}},

 note = {{Accessed on 2025/11/04}}}