@article{article, title  = {{Excess leakage-current noise in junction field-effect transistors}},

 publisher = {{Institution of Engineering and Technology (IET)}},

 url = {{https://doi.org/10.1049/el:19700282 }},

 year = {{1970}},

 month = {{6}},

 author = {{Hawkins RJ and Bloodworth GG}},

 doi = {{10.1049/el:19700282}},

 volume = {{6}},

 journal = {{Electronics Letters}},

 issue = {{13}},

 pages = {{401-403}},

 note = {{Accessed on 2026/02/04}}}