TY  - JOUR

T1  - Measuring non-destructively the total indium content and its lateral distribution in very thin single layers or quantum dots deposited onto gallium arsenide substrates using energy-dispersive X-ray spectroscopy in a scanning electron microscope

JO  - Nanomaterials

UR  - https://eprints.whiterose.ac.uk/id/eprint/189063

PY  - 2022/06/28

AU  - Walther T

ED  - 

DO  - DOI: 10.3390/nano12132220

PB  - MDPI AG

VL  - 12

IS  - 13

Y2  - 2025/12/01

ER  -