@article{article, title  = {{Recent developments in transmission electron microscopy for crystallographic characterization of strained semiconductor heterostructures}},

 publisher = {{MDPI AG}},

 url = {{https://eprints.whiterose.ac.uk/id/eprint/223516 }},

 year = {{2025}},

 month = {{2}},

 author = {{Gong T and Chen L and Wang X and Qiu Y and Liu H and Yang Z and Walther T}},

 doi = {{10.3390/cryst15020192}},

 volume = {{15}},

 journal = {{Crystals}},

 issue = {{2}},

 note = {{Accessed on 2025/12/01}}}