TY  - JOUR

T1  - Recent developments in transmission electron microscopy for crystallographic characterization of strained semiconductor heterostructures

JO  - Crystals

UR  - https://eprints.whiterose.ac.uk/id/eprint/223516

PY  - 2025/02/17

AU  - Gong T

AU  - Chen L

AU  - Wang X

AU  - Qiu Y

AU  - Liu H

AU  - Yang Z

AU  - Walther T

ED  - 

DO  - DOI: 10.3390/cryst15020192

PB  - MDPI AG

VL  - 15

IS  - 2

Y2  - 2025/12/01

ER  -