TY  - JOUR

T1  - Random path length analysis of gain and noise in e-APDs for electron ionisation characterisation

JO  - Semiconductor Science and Technology

UR  - https://doi.org/10.1088/1361-6641/ae27ee

PY  - 2025/12/16

AU  - Ong DS

AU  - Tan AH

AU  - Jin X

AU  - David JPR

ED  - 

DO  - DOI: 10.1088/1361-6641/ae27ee

PB  - IOP Publishing

VL  - 40

IS  - 12

SP  - 125011

EP  - 125011

Y2  - 2025/12/23

ER  -