TY  - CONF

T1  - Sensitivity of lumped parameter battery models to constituent parallel-RC element parameterisation error

JO  - IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society

UR  - https://doi.org/10.1109/iecon.2014.7049367

PY  - 2014/02/24

AU  - Nejad S

AU  - Gladwin DT

AU  - Stone DA

ED  - 

DO  - DOI: 10.1109/iecon.2014.7049367

PB  - IEEE

SP  - 5660

EP  - 5665

Y2  - 2025/11/01

ER  -