TY  - JOUR

T1  - Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy

JO  - Crystal Research and Technology

UR  - https://eprints.whiterose.ac.uk/id/eprint/91479

UR  - http://dx.doi.org/10.1002/crat.201400157

PY  - 2014/07/03

AU  - Walther T

AU  - Richards RD

AU  - Bastiman F

ED  - Neumann W

DO  - DOI: 10.1002/crat.201400157

PB  - Wiley-VCH Verlag

VL  - 50

IS  - 1

SP  - 38

EP  - 42

Y2  - 2025/12/01

ER  -