Scanning electron microscopy

Scanning electron microscopy (SEM) is used to take high-resolution images of surface preparations and microstructures. In our research, we use SEM to examine the fine structural features of cells within the auditory system under various experimental conditions. This technique is especially valuable for identifying morphological changes associated with hearing impairments, including damage from noise exposure, aging, or genetic alterations. These structural insights help us link cellular integrity to functional outcomes, deepening our understanding of the physical basis of hearing loss.