Professor John Rodenburg

FRS, PhD, BSc

Department of Electronic and Electrical Engineering

Professor of Computational Microscopy

Faculty Director of Ion and Electron Microscopy

Imaging: Ptychography Lensless X-ray Electron Light Research Group

Semiconductor Materials and Devices Research Group

Profile picture of Prof John Rodenburg
j.m.rodenburg@sheffield.ac.uk
+44 114 222 5391

Full contact details

Professor John Rodenburg
Department of Electronic and Electrical Engineering
Profile

I studied Physics as an undergraduate at the University of Exeter and then did my PhD in the Cavendish Laboratory, University of Cambridge, where later I held a Royal Society University Research Fellowship.

I was also a Fellow of Murry Edwards College (formerly New Hall), where I taught physics and mathematics.

After a brief excursion from academic life to set up my first company, I moved to Sheffield Hallam University to take up the Chair of Materials Analysis in the Materials and Engineering Research Institute (MERI). I moved to the EEE Department in University of Sheffield in 2003.

My research career started with instrument development to record coherent electron diffraction patterns. Results from this led me to have an idea about how to improve transmission microscopes for atomic imaging by using an inverse computational method, now referred to as ‘ptychography’.

My original formulation of ptychography proved to be rather harder to do experimentally than I expected, and so I gave up on it at the end of the 1990s. However, I returned to it afresh in the 2000s, developing a completely new iterative solution to the phase problem.

Ptychography has since become a standard technique in X-ray microscopy, and has made substantial impact in EUV, electron and visible-light microscopy.

I continue to develop various forms of it. I set up a second company (Phase Focus Ltd) in 2006, working for it part time as Chief Scientific Officer until 2015.

Qualifications
  • Fellow of the Royal Society
  • Chartered Physicist
  • PhD in Physics (University of Cambridge)
  • BSc in Physics with Electronics (University of Exeter)
Research interests
  • The theory and modelling of inverse computational imaging strategies
  • Diffractive imaging, specifically ptychography
  • Experimental X-ray, electron and visible-light ptychography
  • Electron microscopy and associated spectroscopies
  • Development of experimental configurations in X-ray microscopy
  • Instrument and detector development in electron microscopy
  • Applications of electron microscopy to materials science
Publications

Journal articles

Chapters

Conference proceedings papers

  • Rodenburg JM, Cao S & Maiden AM (2016) OPTICAL ARRANGEMENTS FOR PHASE-SENSITIVE IMAGING USING ELECTRON PTYCHOGRAPHY. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 60-61) RIS download Bibtex download
  • Rodenburg JM (2014) Ptychography: lensless high-resolution phase-sensitive imaging. Classical Optics 2014, 2014. RIS download Bibtex download
  • Claus D, Iliescu D, Watson J & Rodenburg J (2012) Comparison of different digital holographic setup configurations. Biomedical Optics and 3-D Imaging, 2012. RIS download Bibtex download
  • Rodenburg JM (2012) Ptychography - early history and 3D scattering effects. SHORT-WAVELENGTH IMAGING AND SPECTROSCOPY SOURCES, Vol. 8678 RIS download Bibtex download
  • Claus D, Robinson DJ, Chetwynd DG, Shuo Y, Pike WT & Rodenburg JM (2012) Ptychography applied to optical metrology. SPECKLE 2012: V INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, Vol. 8413 RIS download Bibtex download
  • Rodenburg JM, Maiden AM & Humphry MJ (2010) TRANSMISSION AND REFLECTION MICROSCOPY WITHOUT LENSES. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 61-62) RIS download Bibtex download
  • Walther T, Atkinson K, Sweeney F & Rodenburg JM (2008) Measuring coherence in an electron beam for imaging. EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 165-166). Berlin, 1 September 2008 - 5 September 2008. RIS download Bibtex download
  • Liu C, Walther T & Rodenburg JM (2008) Investigating the influence of dynamic scattering on ptychographical iterative techniques. EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 723-724). Berlin, 1 September 2008 - 5 September 2008. RIS download Bibtex download
  • Atkinson KM, Sweeney F & Rodenburg JM (2008) STEM probe characteristics at large defoci for use in ptychographical imaging. - art. no. 012092. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12092-12092) RIS download Bibtex download
  • Fielden IM & Rodenburg JM (2004) A technique for real-time, in situ SEM observation of grain growth at elevated temperatures. RECRYSTALLIZATION AND GRAIN GROWTH, PTS 1 AND 2, Vol. 467-470 (pp 1385-1388) RIS download Bibtex download
  • Xu H, Akid R, Brumpton G, Wang H & Rodenburg JM (2004) Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 417-420) RIS download Bibtex download
  • Fielden IM, Cawley J & Rodenburg JM (2004) Backscattered SEM imaging of high-temperature samples for grain growth studies in metals. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 181-184) RIS download Bibtex download
  • Rodenburg JM (2004) Can Ronchigrams provide a route to sub-angstrom tomographic reconstruction?. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 185-190) RIS download Bibtex download
  • Meidia H, Cullis AG, Schonjahn C, Munz WD & Rodenburg JM (2002) Investigation of intermixing in TiAlN/VN nanoscale multilayer coatings by energy-filtered TEM. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 209-213) RIS download Bibtex download
  • Macak EB, Munz WD & Rodenburg JM (2002) Electron microscopy studies of hard coatings deposited on sharp edges by combined cathodic arc/unbalanced magnetron PVD. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 349-354) RIS download Bibtex download
  • Rodenburg JM (2001) Time- and space-dependent image contrast mechanisms in environmental scanning electron microscopy (ESEM). ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 73-76) RIS download Bibtex download
  • Macak EB, Munz WD & Rodenburg JM (2001) Quantitative EDX-analysis of PVD hard coatings deposited on sharp edges. ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 345-348) RIS download Bibtex download
  • Rodenburg JM (1999) Measurement of higher-order correlation functions in amorphous materials via coherent microdiffraction. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 145-148) RIS download Bibtex download
  • Rodenburg JM & Lupini AR (1999) Measuring lens parameters from coherent Ronchigrams in STEM. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 339-342) RIS download Bibtex download
  • James EM & Rodenburg JM (1997) A method for measuring the effective source coherence in a field emission transmission electron microscope. APPLIED SURFACE SCIENCE, Vol. 111 (pp 174-179) RIS download Bibtex download
  • James EM, Bleloch AL & Rodenburg JM (1997) A novel ultra-sharp field emission electron source demonstrated in a STEM. ELECTRON MICROSCOPY AND ANALYSIS 1997(153) (pp 65-68) RIS download Bibtex download
  • Colman CP & Rodenburg JM (1997) Super-resolution STEM imaging of crystals with large unit cells. ELECTRON MICROSCOPY AND ANALYSIS 1997(153) (pp 117-120) RIS download Bibtex download
  • James EM, McCallum BC & Rodenburg JM (1995) Measurement and improvement of the effective source coherence in STEM. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 277-280) RIS download Bibtex download
  • Landauer MN & Rodenburg JM (1995) Experimental tests of double-resolution imaging with quadrant detectors in the STEM. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 281-284) RIS download Bibtex download
  • Colman CP & Rodenburg JM (1995) Super-resolution STEM imaging in the presence of specimen drift. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 107-110) RIS download Bibtex download
  • Plamann T & Rodenburg JM (1995) Ptychographical imaging of sphalerite structures. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 117-120) RIS download Bibtex download
  • MCCALLUM BC, RODENBURG JM & NELLIST PD (1994) Direct measurement of the effective source coherence in STEM. ELECTRON MICROSCOPY 1994, VOL 1 (pp 209-210) RIS download Bibtex download
  • NELLIST PD, MCCALLUM BC & RODENBURG JM (1994) STEM imaging of <110> tetrahedral semiconductors. ELECTRON MICROSCOPY 1994, VOL 1 (pp 489-490) RIS download Bibtex download
  • PLAMANN T & RODENBURG JM (1994) Simulations on super-resolution imaging of perfect crystals. ELECTRON MICROSCOPY 1994, VOL 1 (pp 939-940) RIS download Bibtex download
  • LANDAUER MN & RODENBURG JM (1994) Double-resolution imaging with quadrant detectors in STEM. ELECTRON MICROSCOPY 1994, VOL 1 (pp 155-156) RIS download Bibtex download
  • KAWASAKI T & RODENBURG JM (1993) DECONVOLVING LENS TRANSFER-FUNCTIONS IN ELECTRON HOLOGRAMS. ULTRAMICROSCOPY, Vol. 52(3-4) (pp 248-252) RIS download Bibtex download
  • NELLIST PD & RODENBURG JM (1993) IMAGE-RESOLUTION IMPROVEMENT USING COHERENT MICRODIFFRACTION IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 239-242) RIS download Bibtex download
  • PLAMANN T & RODENBURG JM (1993) THICKNESS LIMITATIONS OF ABERRATION-FREE PROJECTION IMAGING. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 243-246) RIS download Bibtex download
  • LANDAUER MN & RODENBURG JM (1993) DIRECT COMPLEX TRANSFER-FUNCTION RECONSTRUCTION BY PROCESSING OF NEAR-FOCUS SHADOW IMAGES IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 251-254) RIS download Bibtex download
  • AITCHISON PR, RODENBURG JM & BROWN LM (1993) INFORMATION IN RONCHIGRAMS OF A SUPERLATTICE FROM DEFOCUSED MICRODIFFRACTION IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 167-170) RIS download Bibtex download
  • AITCHISON PR & RODENBURG JM (1991) MICRODIFFRACTION MEASUREMENTS OF STRAIN IN A STEM. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 409-412) RIS download Bibtex download
  • FRIEDMAN SL, RODENBURG JM & MCCALLUM BC (1991) PHASE RECONSTRUCTION IMAGING IN SCANNING-TRANSMISSION MICROSCOPY VIA THE MICRODIFFRACTION PLANE. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 491-494) RIS download Bibtex download
  • AKROBOTU KH & RODENBURG JM (1991) APERTURE FRINGE EFFECTS IN COHERENT CBED PATTERNS. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 395-396) RIS download Bibtex download
  • RODENBURG JM & RAUF IA (1990) A CROSS-CORRELATION MEASURE OF ORDER IN AMORPHOUS INDIUM OXIDE. EMAG-MICRO 89, VOLS 1 AND 2, Vol. 98 (pp 119-122) RIS download Bibtex download
  • MUROOKA Y, RODENBURG JM & WALLS MG (1990) HIGH-RESOLUTION TIME RESOLVED EELS AND CACO3. TRANSACTIONS OF THE ROYAL MICROSCOPICAL SOCIETY : NEW SERIES, VOL 1, Vol. 1 (pp 185-188) RIS download Bibtex download
  • RODENBURG JM (1990) HIGHER SPATIAL-RESOLUTION VIA SIGNAL-PROCESSING OF THE MICRODIFFRACTION PLANE. EMAG-MICRO 89, VOLS 1 AND 2, Vol. 98 (pp 103-106) RIS download Bibtex download
  • BROWN LM, RODENBURG JM & PIKE WT (1988) MICRODIFFRACTION. EUREM 88, VOLS 1-3, Vol. 93 (pp 3-8) RIS download Bibtex download
Grants
Dates Sponsor Grant Title PI/co-I
Sept 11 - Feb 17 EPSRC Phase modulation technology for X-ray imaging Co-I
Teaching activities
  • EEE6226, Future trends in Electronic and Electrical Engineering
Professional activities
  • Faculty Director of Ion and Electron Microscopy
Research students
Student Degree Status Primary/Secondary
Atkinson K M  PhD Graduated Primary
Batey D PhD Graduated Primary
Cao S PhD Graduated Primary
Edo T B PhD Graduated Primary
Li P PhD Graduated  Primary