Dr Cornelia Rodenburg
EPSRC Early Career Fellow, Dipl. Ing (FH), PhD
Department of Materials Science and Engineering
Senior Lecturer

+44 114 222 5921
Full contact details
Department of Materials Science and Engineering
Sir Robert Hadfield Building
Mappin Street
Sheffield
S1 3JD
- Profile
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Dr Rodenburg was awarded a Royal Society Dorothy Hodgkin Fellowship entitled "Applications of MEMS electrostatic manipulation in SEM and materials science" which she took up in 2006, and after a brief spell as University teacher, now holds an EPSRC Early Career Fellowship and is a Senior Lecturer in Materials Science & Engineering.
- Research interests
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My research is centred on the use of electrons and ions for the characterisation and modification of micro-and nanostructured materials. This includes the development and application of novel characterisation techniques, alongside the study of damage and charging phenomena for targeted materials properties modification and transport. Recent key projects include:
- Nano-morphology of polymer blends for organic photovoltaics (collaboration with Trinity College Dublin and UoS Department of Physics)
- Novel Polymer composites for Additive manufacturing (collaboration with UoS Mechanical Engineering (Advanced Additive Manufacturing Group))
- Secondary electron spectroscopy in the scanning electron microscope (collaboration with FEI company) and EPSRC funded project.
- Characterisation of Natural materials
Previous research interests:
- The role of the substrate/coating interface of ceramic hard coatings for dry high-speed cutting applications
- Influence of carbide distributions on properties and wear of high-speed steels
Research centres
- Publications
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Journal articles
- Controlling PbI2 stoichiometry during synthesis to improve the performance of perovskite photovoltaics. Chemistry of Materials. View this article in WRRO
- Identifying and mapping chemical bonding within phenolic resin using Secondary Electron Hyperspectral Imaging. Polymer Chemistry. View this article in WRRO
- Tensegrity modelling and the high toughness of spider dragline silk. Nanomaterials, 10(8). View this article in WRRO
- Cover Picture: Plasma Process. Polym. 1/2020. Plasma Processes and Polymers, 17(1), 2070001-2070001. View this article in WRRO
- An accurate device for apparent emissivity characterisation in controlled atmospheric conditions up to 1423 K. IEEE Transactions on Instrumentation and Measurement. View this article in WRRO
- Making sense of complex carbon and metal/carbon systems by secondary electron hyperspectral imaging. Advanced Science. View this article in WRRO
- Optimizing size and distribution of voids in phenolic resins through the choice of catalyst types. Journal of Applied Polymer Science. View this article in WRRO
- Exploiting Plasma Exposed, Natural Surface Nanostructures in Ramie Fibers for Polymer Composite Applications. Materials, 12(10). View this article in WRRO
- Revealing spider silk’s 3D nanostructure through low temperature plasma etching and advanced low-voltage SEM. Frontiers in Materials, 5. View this article in WRRO
- Novel plasma treatment for preparation of laser sintered nanocomposite parts. Additive Manufacturing, 25, 297-306. View this article in WRRO
- Localized effect of PbI2 excess in perovskite solar cells probed by high-resolution chemical–optoelectronic mapping. Journal of Materials Chemistry A, 6(45), 23010-23018. View this article in WRRO
- Stoichiometry-dependent local instability in MAPbI3 perovskite materials and devices. Journal of Materials Chemistry A. View this article in WRRO
- High-Efficiency Spray-Coated Perovskite Solar Cells Utilizing Vacuum-Assisted Solution Processing.. ACS Applied Materials & Interfaces, 10(46), 39428-39434. View this article in WRRO
- High-Performance Multilayer Encapsulation for Perovskite Photovoltaics. Advanced Energy Materials, 8(24). View this article in WRRO
- Surface modification of the laser sintering standard powder polyamide 12 by plasma treatments. Plasma Processes and Polymers, 15(7). View this article in WRRO
- Cover Picture: Plasma Process. Polym. 7/2018. Plasma Processes and Polymers, 15(7), 1870015-1870015. View this article in WRRO
- New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope. MRS Communications. View this article in WRRO
- An Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite. Journal of Physical Chemistry C, 122(18), 10159-10166. View this article in WRRO
- View this article in WRRO
- Dark electrical bias effects on moisture-induced degradation in inverted lead halide perovskite solar cells measured by using advanced chemical probes. Sustainable Energy Fuels. View this article in WRRO
- Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging. Advanced Materials, 29(47). View this article in WRRO
- Comparative study of image contrast in scanning electron microscope and helium ion microscope. Journal of Microscopy, 268(3), 313-320. View this article in WRRO
- Searching for order in atmospheric pressure plasma jets. Plasma Physics and Controlled Fusion, 60(1). View this article in WRRO
- Nanoclay/Polymer Composite Powders for Use in Laser Sintering Applications: Effects of Nanoclay Plasma Treatment. JOM, 69(11), 2278-2285. View this article in WRRO
- Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?. Journal of Electron Spectroscopy and Related Phenomena. View this article in WRRO
- Efficient perovskite photovoltaic devices using chemically doped PCDTBT as a hole-transport material. Journal of Materials Chemistry A, 5(30), 15714-15723. View this article in WRRO
- Nanoscale Mapping of Bromide Segregation on the Cross Sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in a Scanning Electron Microscope. ACS Omega, 2(5), 2126-2133. View this article in WRRO
- Optimized organometal halide perovskite solar cell fabrication through control of nanoparticle crystal patterning. Journal of Materials Chemistry C. View this article in WRRO
- Novel organic photovoltaic polymer blends: A rapid, 3-dimensional morphology analysis using backscattered electron imaging in the scanning electron microscope. Solar Energy Materials and Solar Cells, 160, 182-192. View this article in WRRO
- Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: simulation & experiment for polymers. Ultramicroscopy, 171, 126-138. View this article in WRRO
- Sub-5 nm graphene nanopore fabrication by nitrogen ion etching induced by a low-energy electron beam. Nanotechnology, 27(19).
- Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. Scientific Reports, 6. View this article in WRRO
- Indium-free multilayer semi-transparent electrodes for polymer solar cells. Solar Energy Materials and Solar Cells, 144, 600-607. View this article in WRRO
- The effect of residual palladium catalyst on the performance and stability of PCDTBT:PC70BM organic solar cells. Organic Electronics, 27, 266-273. View this article in WRRO
- Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy. Nature Communications, 6. View this article in WRRO
- High-efficiency inverted polymer solar cells via dual effects of introducing the high boiling point solvent and the high conductive PEDOT:PSS layer. Organic Electronics, 15(9), 2059-2067.
- Helium ion microscopy based wall thickness and surface roughness analysis of polymer foams obtained from high internal phase emulsion.. Ultramicroscopy, 139, 13-19.
- Helium ion microscopy and energy selective scanning electron microscopy-two advanced microscopy techniques with complementary applications. Journal of Physics: Conference Series, 522(1).
- Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy.. Nano Lett, 11(10), 4275-4281.
- Resolution limits of secondary electron dopant contrast in helium ion and scanning electron microscopy.. Microsc Microanal, 17(4), 637-642.
- Surface morphology of silica nanowires at the nanometer scale. Journal of Non-Crystalline Solids, 357(15), 3042-3045.
- Advantages of Energy Selective Secondary Electron Detection in SEM. Microscopy and Microanalysis, 16(S2), 622-623.
- Helium Ion Microscopy for the Characterization of Complex 3D Structures in a C/CrC Nanocomposite. Microscopy and Microanalysis, 16(S2), 602-603.
- The role of helium ion microscopy in the characterisation of complex three-dimensional nanostructures.. Ultramicroscopy, 110(9), 1178-1184.
- Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping.. Ultramicroscopy, 110(9), 1185-1191.
- Energy filtered scanning electron microscopy: Applications to dopant contrast. Journal of Physics: Conference Series, 209.
- Progress towards site-specific dopant profiling in the scanning electron microscope. Journal of Physics: Conference Series, 209.
- The effect of oxide overlayers on secondary electron dopant mapping.. Microsc Microanal, 15(3), 237-243.
- Quantitative dopant contrast in the helium ion microscope. EPL-EUROPHYS LETT, 86(2).
- Dopant contrast in the helium ion microscope. EPL-EUROPHYS LETT, 85(4).
- Quantitative dopant contrast in the helium ion microscope. EPL, 86(2).
- Dopant contrast in the helium ion microscope. EPL, 85(4).
- One year on: New and unique applications of he ion microscopy. Microscopy and Microanalysis, 15(SUPPL. 2), 652-653.
- A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging. EPL-EUROPHYS LETT, 82(3).
- A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging (vol 82, pg 30006, 2008). EPL-EUROPHYS LETT, 82(4).
- High resolution dopant profiling in the SEM, image widths and surface band-bending. Journal of Physics: Conference Series, 126.
- Oxidation behavior and mechanisms of TiAIN/VN coatings. METALL MATER TRANS A, 38A(10), 2464-2478.
- The Effect of Surface States on Secondary Electron (SE) Dopant Contrast from Silicon p-n Junctions. MRS Proceedings, 1026.
- A quantitative analysis of the influence of carbides size distributions on wear behaviour of high-speed steel in dry rolling/sliding contact. ACTA MATER, 55(7), 2443-2454.
- Quantitative secondary electron energy filtering in a scanning electron microscope and its applications.. Ultramicroscopy, 107(2-3), 140-150.
- The influence of beam energy and oxidation on quantitative carbide analysis in the scanning electron microscope. J APPL PHYS, 100(11).
- High resolution quantitative two-dimensional dopant mapping using energy-filtered secondary electron imaging. J APPL PHYS, 100(5).
- Site-specific dopant profiling in a scanning electron microscope using focused ion beam prepared specimens. APPL PHYS LETT, 88(21).
- Hot workability of spray-formed AISI M3:2 high-speed steel. Materials Science and Engineering A, 386(1-2), 420-427.
- Hot workability of spray-formed AISI M3 : 2 high-speed steel. MAT SCI ENG A-STRUCT, 386(1-2), 420-427.
- Optimizing and quantifying dopant mapping using a scanning electron microscope with a through-the-lens detector. APPL PHYS LETT, 83(2), 293-295.
- Energy-filtered imaging in a field-emission scanning electron microscope for dopant mapping in semiconductors. J APPL PHYS, 92(12), 7667-7671.
- Energy filtered imaging in a FEG-SEM for enhanced dopant contrast. Microscopy and Microanalysis, 8(S02), 718-719.
- Nano-Scale Mapping of Bromide segregation on Cross-sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in The Scanning Electron Microscope. ACS Omega.
- Arginine–glycine–aspartic acid functional branched semi-interpenetrating hydrogels. Soft Matter, 11(38), 7567-7578. View this article in WRRO
- Mapping the potential within a nanoscale undoped GaAs region using a
scanning electron microscope. Appl. Phys. Lett., 84, 2109-2111.
- Solvent vapour annealing of methylammonium lead halide perovskite: what's the catch?. Journal of Materials Chemistry A, 8(21), 10943-10956.
- Characterizing cross‐linking within polymeric biomaterials in the SEM by secondary electron hyperspectral imaging. Macromolecular Rapid Communications. View this article in WRRO
- HelixJet : an innovative plasma source for next‐generation additive manufacturing (3D printing). Plasma Processes and Polymers. View this article in WRRO
- Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging. Advanced Science. View this article in WRRO
- Understanding Surface Modifications Induced via Argon Plasma Treatment through Secondary Electron Hyperspectral Imaging. Advanced Science, 2003762-2003762.
Chapters
- Morphologies of a solvent cast polystyrene-polybutadiene-polystyrene (S-B-S) triblock copolymer characterised by TEM, AFM and Energy Filtered SEM (pp. 748-749). Wiley-VCH Verlag GmbH & Co. KGaA
Conference proceedings papers
- Nanoscale mapping of semi-crystalline polypropylene. Physica Status Solidi. C: Current Topics in Solid State Physics, Vol. 14, 22 May 2017 - 26 May 2017. View this article in WRRO
- Low-Voltage SEM of Natural Plant Fibers: Microstructure Properties (Surface and Cross-Section) and their Link to the Tensile Properties. Procedia Engineering, Vol. 200 (pp 295-302) View this article in WRRO
- Feasibility of Plasma Treated Clay in Clay/Polymer Nanocomposites Powders for use Laser Sintering (LS). IOP Conference Series: Materials Science and Engineering, Vol. 195 (pp 012003-012003) View this article in WRRO
- Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies. Journal of Physics: Conference Series, Vol. 644 (pp 012017-012017) View this article in WRRO
- Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM. Journal of Physics: Conference Series, Vol. 644 (pp 012018-012018) View this article in WRRO
- Helium Ion Microscopy to Study Bulk Hetero Junction Polymer Solar Cell Materials
- Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers
- The Effect of Oxidation and Carbon Contamination on SEM Dopant Contrast. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
- Comparison of multilayered nanowire imaging by SEM and Helium Ion Microscopy. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
- Energy Filtered Scanning Electron Microscopy: applications to characterisation of semiconductors. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
- Dopant Contrast in the Helium Ion Microscope: Contrast Mechanism. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
- Effect of experimental parameters on doping contrast of Si p-n junctions in a FEG-SEM. MICROELECTRONIC ENGINEERING, Vol. 73-74 (pp 948-953)
- Origin of dark electrical bias-induced degradation of inverted methylammonium lead iodide perovskite solar cells. Proceedings of the 2nd Asia-Pacific Hybrid and Organic Photovoltaics, 28 January 2018 - 30 January 2018.
Software / Code
Datasets
- Datasheets for figures in "Nano-Scale Mapping of Bromide segregation on Cross-sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in The Scanning Electron Microscope".
- Dataset of figures presented in "Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers" in Ultramicroscopy.
- Controlling PbI2 stoichiometry during synthesis to improve the performance of perovskite photovoltaics. Chemistry of Materials. View this article in WRRO
- Research group
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Research associates:
- Dr Vikas Kumar: Novel Electron microscopy methods for complex organic-inorganic hybrid systems
- Dr Kerry Abrams: Novel Electron microscopy methods for complex polymers
PhD students:
- Alaa Almansoori: Novel polymer composites
- Sameer Hamad: Enhancing mechanical properties of nano-structured materials through the use of low energy electron and/or ion beams
- Nicola Stehling: Electron microscopy natural materials
- Professional activities
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- 12 invited presentations since 2009, including Microscopy and Microanalysis Meeting 2010 (Portland, USA) and 2011(Nashville, USA), Recent trends in Charged Particle Optics and Surface Physics Instrumentation 2010 and 2016, Slavski Davur, Czech Republic
- Member of IOP and VDI
- Member of the Institute of Physics Electron Microscopy and Analysis Group Committee