Dr Cornelia Rodenburg

EPSRC Early Career Fellow, Dipl. Ing (FH), PhD

Department of Materials Science and Engineering

Senior Lecturer

c.rodenburg@shef.ac.uk
+44 114 222 5921

Sir Robert Hadfield Building

Full contact details

Dr Cornelia Rodenburg
Department of Materials Science and Engineering
Sir Robert Hadfield Building
Mappin Street
Sheffield
S1 3JD

Profile: Dr Rodenburg was awarded a Royal Society Dorothy Hodgkin Fellowship entitled "Applications of MEMS electrostatic manipulation in SEM and materials science" which she took up in 2006, and after a brief spell as University teacher, now holds an EPSRC Early Career Fellowship and is a Senior Lecturer in Materials Science & Engineering.

Research interests

My research is centred on the use of electrons and ions for the characterisation and modification of micro-and nanostructured materials. This includes the development and application of novel characterisation techniques, alongside the study of damage and charging phenomena for targeted materials properties modification and transport. Recent key projects include:

Nano-morphology of polymer blends for organic photovoltaics (collaboration with Trinity College Dublin and UoS Department of Physics)
Novel Polymer composites for Additive manufacturing (collaboration with UoS Mechanical Engineering (Advanced Additive Manufacturing Group))
Secondary electron spectroscopy in the scanning electron microscope (collaboration with FEI company) and EPSRC funded project.
Characterisation of Natural materials

Previous research interests:

The role of the substrate/coating interface of ceramic hard coatings for dry high-speed cutting applications
Influence of carbide distributions on properties and wear of high-speed steels

Research centres

Publications

Journal articles

Wan Q, Yang M, Hu J, Lei F, Shuai Y, Wang J, Holland C, Rodenburg C & Yang M (2021) Mesoscale structure development reveals when a silkworm silk is spun. Nature Communications, 12(1).
Koeppel A, Stehling N, Rodenburg C & Holland C (2021) Spinning beta silks requires both pH activation and extensional stress. Advanced Functional Materials.
Tsevas K, Smith JA, Kumar V, Rodenburg C, Fakis M, Mohd Yusoff ARB, Vasilopoulou M, Lidzey DG, Nazeeruddin MK & Dunbar ADF (2021) Controlling PbI2 stoichiometry during synthesis to improve the performance of perovskite photovoltaics. Chemistry of Materials. View this article in WRRO
Farr NTH, Hamad S, Gray E, Magazzeni C, Longman F, Armstrong D, Foreman J, Claeyssens F, Green N & Rodenburg C (2020) Identifying and mapping chemical bonding within phenolic resin using Secondary Electron Hyperspectral Imaging. Polymer Chemistry. View this article in WRRO
Fraternali F, Stehling N, Amendola A, Tiban Anrango BA, Holland C & Rodenburg C (2020) Tensegrity modelling and the high toughness of spider dragline silk. Nanomaterials, 10(8). View this article in WRRO
Schäfer J, Quade A, Abrams KJ, Sigeneger F, Becker MM, Majewski C & Rodenburg C (2020) Cover Picture: Plasma Process. Polym. 1/2020. Plasma Processes and Polymers, 17(1), 2070001-2070001. View this article in WRRO
Zhu C, Hobbs MJ, Masters RC, Rodenburg C & Willmott JR (2019) An accurate device for apparent emissivity characterisation in controlled atmospheric conditions up to 1423 K. IEEE Transactions on Instrumentation and Measurement. View this article in WRRO
Abrams KJ, Dapor M, Stehling N, Azzolini M, Kyle SJ, Schäfer JS, Quade A, Mika F, Kratky S, Pokorna Z , Konvalina I et al (2019) Making sense of complex carbon and metal/carbon systems by secondary electron hyperspectral imaging. Advanced Science. View this article in WRRO
Hamad SF, Farr N, Fei T, Shukor NF, Dean JS, Hayes SA, Foreman JP & Rodenburg C (2019) Optimizing size and distribution of voids in phenolic resins through the choice of catalyst types. Journal of Applied Polymer Science. View this article in WRRO
Hamad SF, Stehling N, Hayes SA, Foreman JP & Rodenburg C (2019) Exploiting Plasma Exposed, Natural Surface Nanostructures in Ramie Fibers for Polymer Composite Applications. Materials, 12(10). View this article in WRRO
Stehling NA, Abrams KJ, Holland C & Rodenburg C (2019) Revealing spider silk’s 3D nanostructure through low temperature plasma etching and advanced low-voltage SEM. Frontiers in Materials, 5. View this article in WRRO
Almansoori A, Abrams KJ, Ghali Al-Rubaye AD, Majewski C & Rodenburg C (2019) Novel plasma treatment for preparation of laser sintered nanocomposite parts. Additive Manufacturing, 25, 297-306. View this article in WRRO
Barbé J, Newman M, Lilliu S, Kumar V, Lee HKH, Charbonneau C, Rodenburg C, Lidzey D & Tsoi WC (2018) Localized effect of PbI2 excess in perovskite solar cells probed by high-resolution chemical–optoelectronic mapping. Journal of Materials Chemistry A, 6(45), 23010-23018. View this article in WRRO
Kumar V, Barbe J, Schmidt WL, Tsevas K, Ozkan B, Handley CM, Freeman CL, Sinclair DC, Reaney IM, Tsoi WC , Dunbar A et al (2018) Stoichiometry-dependent local instability in MAPbI3 perovskite materials and devices. Journal of Materials Chemistry A. View this article in WRRO
Bishop JE, Smith JA, Greenland C, Kumar V, Vaenas N, Game OS, Routledge TJ, Wong-Stringer M, Rodenburg C & Lidzey DG (2018) High-Efficiency Spray-Coated Perovskite Solar Cells Utilizing Vacuum-Assisted Solution Processing.. ACS Applied Materials & Interfaces, 10(46), 39428-39434. View this article in WRRO
Wong-Stringer M, Game OS, Smith JA, Routledge TJ, Alqurashy BA, Freestone BG, Parnell AJ, Vaenas N, Kumar V, Alawad MOA , Iraqi A et al (2018) High-Performance Multilayer Encapsulation for Perovskite Photovoltaics. Advanced Energy Materials, 8(24). View this article in WRRO
Almansoori AMM, Masters R, Abrams K, Schäfer J, Gerling T, Majewski C & Rodenburg C (2018) Surface modification of the laser sintering standard powder polyamide 12 by plasma treatments. Plasma Processes and Polymers, 15(7). View this article in WRRO
Almansoori A, Masters R, Abrams K, Schäfer J, Gerling T, Majewski C & Rodenburg C (2018) Cover Picture: Plasma Process. Polym. 7/2018. Plasma Processes and Polymers, 15(7), 1870015-1870015. View this article in WRRO
Stehling NA, Masters R, Zhou Y, O'Connell R, Holland C, Zhang H & Rodenburg C (2018) New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope. MRS Communications. View this article in WRRO
Azzolini M, Morresi T, Abrams K, Masters R, Stehling N, Rodenburg C, Pugno NM, Taioli S & Dapor M (2018) An Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite. Journal of Physical Chemistry C, 122(18), 10159-10166. View this article in WRRO
Masters R, Zhang Y, Zhou Y, O'Connell R, Zhang H, Lidzey D & Rodenburg C (2018) Cross-sectioning photovoltaic polymer blends with advanced gas-ion microscopy. Microscopy and Analysis, 32(2), 16-18. View this article in WRRO
Barbe J, Kumar V, Newman MJ, Lee HKH, Jain SM, Chen H, Charbonneau C, Rodenburg C & Wing TC (2018) Dark electrical bias effects on moisture-induced degradation in inverted lead halide perovskite solar cells measured by using advanced chemical probes. Sustainable Energy Fuels. View this article in WRRO
Wan Q, Abrams K, Masters R, Talari , Rehman , Claeyssens , Holland C & Rodenburg C (2017) Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging. Advanced Materials, 29(47). View this article in WRRO
O'CONNELL R, CHEN Y, ZHANG H, ZHOU Y, FOX D, MAGUIRE P, WANG JJ & RODENBURG C (2017) Comparative study of image contrast in scanning electron microscope and helium ion microscope. Journal of Microscopy, 268(3), 313-320. View this article in WRRO
Schäfer J, Sigeneger F, Šperka J, Rodenburg C & Foest R (2017) Searching for order in atmospheric pressure plasma jets. Plasma Physics and Controlled Fusion, 60(1). View this article in WRRO
Almansoori A, Majewski C & Rodenburg C (2017) Nanoclay/Polymer Composite Powders for Use in Laser Sintering Applications: Effects of Nanoclay Plasma Treatment. JOM, 69(11), 2278-2285. View this article in WRRO
Dapor M, Masters R, Ross I, Lidzey DG, Pearson AJ, Abril I, Garcia-Molina R, Sharp J, Uncovsky M, Vystavel T , Mika F et al (2017) Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?. Journal of Electron Spectroscopy and Related Phenomena. View this article in WRRO
Stringer M, Bishop JE, Smith JA, Mohamad DK, Parnell A, Kumar V, Rodenburg C & Lidzey DG (2017) Efficient perovskite photovoltaic devices using chemically doped PCDTBT as a hole-transport material. Journal of Materials Chemistry A, 5(30), 15714-15723. View this article in WRRO
Kumar V, Schmidt W, Schileo G, Masters R, Stringer M, Sinclair D, Reaney I, Lidzey D & Rodenburg C (2017) Nanoscale Mapping of Bromide Segregation on the Cross Sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in a Scanning Electron Microscope. ACS Omega, 2(5), 2126-2133. View this article in WRRO
Mohamad DK, Freestone B, Masters RC, Reinhardt M, Canning SL, Rodenburg C & Lidzey DG (2017) Optimized organometal halide perovskite solar cell fabrication through control of nanoparticle crystal patterning. Journal of Materials Chemistry C. View this article in WRRO
Masters RC, Wan Q, Zhang Y, Dapor M, Sandu AM, Jiao C, Zhou Y, Zhang H, Lidzey DG & Rodenburg C (2017) Novel organic photovoltaic polymer blends: A rapid, 3-dimensional morphology analysis using backscattered electron imaging in the scanning electron microscope. Solar Energy Materials and Solar Cells, 160, 182-192. View this article in WRRO
Wan Q, Masters RC, Lidzey D, Abrams KJ, Dapor M, Plenderleith RA, Rimmer S, Claeyssens F & Rodenburg C (2016) Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: simulation & experiment for polymers. Ultramicroscopy, 171, 126-138. View this article in WRRO
Fox DS, Maguire P, Zhou Y, Rodenburg C, O’Neill A, Coleman JN & Zhang H (2016) Sub-5 nm graphene nanopore fabrication by nitrogen ion etching induced by a low-energy electron beam. Nanotechnology, 27(19).
Zhou Y, Fox DS, Maguire P, O’Connell R, Masters R, Rodenburg C, Wu H, Dapor M, Chen Y & Zhang H (2016) Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. Scientific Reports, 6. View this article in WRRO
Barrows AT, Masters R, Pearson AJ, Rodenburg C & Lidzey DG (2016) Indium-free multilayer semi-transparent electrodes for polymer solar cells. Solar Energy Materials and Solar Cells, 144, 600-607. View this article in WRRO
Bracher C, Yi H, Scarratt NW, Masters R, Pearson AJ, Rodenburg C, Iraqi A & Lidzey DG (2015) The effect of residual palladium catalyst on the performance and stability of PCDTBT:PC70BM organic solar cells. Organic Electronics, 27, 266-273. View this article in WRRO
Masters RC, Pearson AJ, Glen TS, Sasam F-C, Li L, Dapor M, Donald AM, Lidzey DG & Rodenburg C (2015) Sub-nanometre resolution imaging of polymer–fullerene photovoltaic blends using energy-filtered scanning electron microscopy. Nature Communications, 6. View this article in WRRO
Kumar V, Wang H & Rodenburg C (2014) High-efficiency inverted polymer solar cells via dual effects of introducing the high boiling point solvent and the high conductive PEDOT:PSS layer. Organic Electronics, 15(9), 2059-2067.
Rodenburg C, Viswanathan P, Jepson MAE, Liu X & Battaglia G (2014) Helium ion microscopy based wall thickness and surface roughness analysis of polymer foams obtained from high internal phase emulsion.. Ultramicroscopy, 139, 13-19.
Rodenburg C, Jepson MAE, Boden SA & Bagnall DM (2014) Helium ion microscopy and energy selective scanning electron microscopy-two advanced microscopy techniques with complementary applications. Journal of Physics: Conference Series, 522(1).
Pearson AJ, Boden SA, Bagnall DM, Lidzey DG & Rodenburg C (2011) Imaging the bulk nanoscale morphology of organic solar cell blends using helium ion microscopy.. Nano Lett, 11(10), 4275-4281.
Jepson M, Liu X, Bell D, Ferranti D, Inkson B & Rodenburg C (2011) Resolution limits of secondary electron dopant contrast in helium ion and scanning electron microscopy.. Microsc Microanal, 17(4), 637-642.
Rodenburg C, Liu X, Jepson MAE, Boden SA & Brambilla G (2011) Surface morphology of silica nanowires at the nanometer scale. Journal of Non-Crystalline Solids.
Rodenburg C, Liu X, Jepson MAE, Boden SA & Brambilla G (2011) Surface morphology of silica nanowires at the nanometer scale. Journal of Non-Crystalline Solids, 357(15), 3042-3045.
Rodenburg C, Jepson MAE & Bosch E (2010) Advantages of Energy Selective Secondary Electron Detection in SEM. Microscopy and Microanalysis, 16(S2), 622-623.
Zhou Z, Jepson MAE, Liu X, Rainforth WM & Rodenburg C (2010) Helium Ion Microscopy for the Characterization of Complex 3D Structures in a C/CrC Nanocomposite. Microscopy and Microanalysis, 16(S2), 602-603.
Rodenburg C, Liu X, Jepson MAE, Zhou Z, Rainforth WM & Rodenburg JM (2010) The role of helium ion microscopy in the characterisation of complex three-dimensional nanostructures.. Ultramicroscopy, 110(9), 1178-1184.
Rodenburg C, Jepson MAE, Bosch EGT & Dapor M (2010) Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping.. Ultramicroscopy, 110(9), 1185-1191.
Rodenburg C, Jepson E, Inkson J, Bosch E, Chee W & Humphreys J (2010) Energy filtered scanning electron microscopy: Applications to dopant contrast. Journal of Physics: Conference Series, 209.
Jepson MAE, Inkson BJ, Beanland R, Chee AKW, Humphreys CJ & Rodenburg C (2010) Progress towards site-specific dopant profiling in the scanning electron microscope. Journal of Physics: Conference Series, 209.
Dapor M, Jepson MAE, Inkson BJ & Rodenburg C (2009) The effect of oxide overlayers on secondary electron dopant mapping.. Microsc Microanal, 15(3), 237-243.
Jepson MAE, Inkson BJ, Liu X, Scipioni L & Rodenburg C (2009) Quantitative dopant contrast in the helium ion microscope. EPL-EUROPHYS LETT, 86(2).
Jepson MAE, Inkson BJ, Rodenburg C & Bell DC (2009) Dopant contrast in the helium ion microscope. EPL-EUROPHYS LETT, 85(4).
Jepson MAE, Inkson BJ, Liu X, Scipioni L & Rodenburg C (2009) Quantitative dopant contrast in the helium ion microscope. EPL, 86(2).
Jepson MAE, Inkson BJ, Rodenburg C & Bell DC (2009) Dopant contrast in the helium ion microscope. EPL, 85(4).
Bell DC, Erdman N, Jepson MA, Rodenburg C & Inkson BJ (2009) One year on: New and unique applications of he ion microscopy. Microscopy and Microanalysis, 15(SUPPL. 2), 652-653.
Dapor M, Inkson BJ, Rodenburg C & Rodenburg JM (2008) A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging. EPL-EUROPHYS LETT, 82(3).
Dapor M, Inkson BJ, Rodenburg C & Rodenburg JM (2008) A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging (vol 82, pg 30006, 2008). EPL-EUROPHYS LETT, 82(4).
Dapor M, Inkson BJ, Rodenburg C & Rodenburg JM (2008) A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging (Europhysics Letters (EPL) (2008) 82 (30006)). Europhysics Letters, 82(4).
Chee KWA, Rodenburg C & Humphreys CJ (2008) High resolution dopant profiling in the SEM, image widths and surface band-bending. Journal of Physics: Conference Series, 126.
Zhou Z, Rainforth WM, Rodenburg C, Hyatt NC, Lewis DB & Hovsepian PE (2007) Oxidation behavior and mechanisms of TiAIN/VN coatings. METALL MATER TRANS A, 38A(10), 2464-2478.
Chee AKW, Rodenburg C & Humphreys CJ (2007) The Effect of Surface States on Secondary Electron (SE) Dopant Contrast from Silicon p-n Junctions. MRS Proceedings, 1026.
Rodenburg C & Rainforth WM (2007) A quantitative analysis of the influence of carbides size distributions on wear behaviour of high-speed steel in dry rolling/sliding contact. ACTA MATER, 55(7), 2443-2454.
Kazemian P, Mentink SAM, Rodenburg C & Humphreys CJ (2007) Quantitative secondary electron energy filtering in a scanning electron microscope and its applications.. Ultramicroscopy, 107(2-3), 140-150.
Rodenburg C & Rainforth WM (2006) The influence of beam energy and oxidation on quantitative carbide analysis in the scanning electron microscope. J APPL PHYS, 100(11).
Kazemian P, Mentink SAM, Rodenburg C & Humphreys CJ (2006) High resolution quantitative two-dimensional dopant mapping using energy-filtered secondary electron imaging. J APPL PHYS, 100(5).
Kazemian P, Twitchett AC, Humphreys CJ & Rodenburg C (2006) Site-specific dopant profiling in a scanning electron microscope using focused ion beam prepared specimens. APPL PHYS LETT, 88(21).
RODENBURG C, KRZYZANOWSKI M, BEYNON J & RAINFORTH W (2004) Hot workability of spray-formed AISI M3:2 high-speed steel. Materials Science and Engineering A, 386(1-2), 420-427.
Rodenburg C, Krzyzanowski M, Beynon JH & Rainforth WM (2004) Hot workability of spray-formed AISI M3 : 2 high-speed steel. MAT SCI ENG A-STRUCT, 386(1-2), 420-427.
Schonjahn C, Broom RF, Humphreys CJ, Howie A & Mentink SAM (2003) Optimizing and quantifying dopant mapping using a scanning electron microscope with a through-the-lens detector. APPL PHYS LETT, 83(2), 293-295.
Schonjahn C, Humphreys CJ & Glick M (2002) Energy-filtered imaging in a field-emission scanning electron microscope for dopant mapping in semiconductors. J APPL PHYS, 92(12), 7667-7671.
Schönjahn C, Humphreys CJ & Glick M (2002) Energy filtered imaging in a FEG-SEM for enhanced dopant contrast. Microscopy and Microanalysis, 8(S02), 718-719.
Ehiasarian AP, Macak KA, Schönjahn C, New R & Münz WD (2001) Characterization of arc discharge plasmas in the combined steered arc/unbalanced magnetron deposition process. Proceedings, Annual Technical Conference - Society of Vacuum Coaters, 382-387.
Munz WD, Lewis DB, Hovsepian PE, Schonjahn C, Ehiasarian A & Smith IJ (2001) Industrial scale manufactured superlattice hard PVD coatings. SURF ENG, 17(1), 15-27.
Münz WD, Schönjahn C, Paritong H & Smith IJ (2000) Hard coatings deposited by combined cathodic arc evaporation and magnetron sputtering (arc bond sputtering : Abs). Vide: Science, Technique et Applications, 2000(297), 205-223.
Schonjahn C, Lewis DB, Munz WD & Petrov I (2000) Substrate ion etching in combined steered cathodic arc-UBM deposition system: Effects on interface architecture, adhesion, and tool performance. SURFACE ENG, 16(2), 176-180.
Kumar V () Nano-Scale Mapping of Bromide segregation on Cross-sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in The Scanning Electron Microscope. ACS Omega.
Plenderleith RA, Pateman CJ, Rodenburg C, Haycock JW, Claeyssens F, Sammon C & Rimmer S () Arginine–glycine–aspartic acid functional branched semi-interpenetrating hydrogels. Soft Matter, 11(38), 7567-7578. View this article in WRRO
Kaestner B, Rodenburg C & Humphreys CJ () Mapping the potential within a nanoscale undoped GaAs region using a scanning electron microscope. Appl. Phys. Lett., 84, 2109-2111.
Game OS, Smith JA, Alanazi TI, Wong-Stringer M, Kumar V, Rodenburg C, Terrill NJ & Lidzey DG () Solvent vapour annealing of methylammonium lead halide perovskite: what's the catch?. Journal of Materials Chemistry A, 8(21), 10943-10956.
Farr N, Pashneh‐Tala S, Stehling N, Claeyssens F, Green N & Rodenburg C () Characterizing cross‐linking within polymeric biomaterials in the SEM by secondary electron hyperspectral imaging. Macromolecular Rapid Communications. View this article in WRRO
Schäfer J, Quade A, Abrams KJ, Sigeneger F, Becker MM, Majewski C & Rodenburg C () HelixJet : an innovative plasma source for next‐generation additive manufacturing (3D printing). Plasma Processes and Polymers. View this article in WRRO
Masters RC, Stehling N, Abrams K, Kumar V, Azzolini M, Pugno N, Dapor M, Huber A, Schäfer P, Lidzey D & Rodenburg C () Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging. Advanced Science. View this article in WRRO
Farr N, Thanarak J, Schäfer J, Quade A, Claeyssens F, Green N & Rodenburg C () Understanding Surface Modifications Induced via Argon Plasma Treatment through Secondary Electron Hyperspectral Imaging. Advanced Science, 2003762-2003762.
Farr NTH, Hughes GM & Rodenburg C () Monitoring Carbon in Electron and Ion Beam Deposition within FIB-SEM. Materials, 14(11), 3034-3034.

Chapters

Zhou Z, Doak SS, Grandy DB, Abrams KJ, Rodenburg C, Weston N & Hourston DJ () Morphologies of a solvent cast polystyrene-polybutadiene-polystyrene (S-B-S) triblock copolymer characterised by TEM, AFM and Energy Filtered SEM (pp. 748-749). Wiley-VCH Verlag GmbH & Co. KGaA

Conference proceedings papers

Rodenburg C, Masters R, Abrams K, Dapor M, Kratky S & Mika F (2018) SECONDARY ELECTRON HYPER SPECTRAL IMAGING IN HELIOS NANOLAB - MAPPING MATERIALS PROPERTIES OR ARTEFACTS?. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 68-68)
Abrams KJ, Wan Q, Stehling N, Jiao C, Talari A, Rehman I & Rodenburg C (2017) Nanoscale mapping of semi-crystalline polypropylene. Physica Status Solidi. C: Current Topics in Solid State Physics, Vol. 14, 22 May 2017 - 26 May 2017. View this article in WRRO
Hamad SF, Stehling N, Holland C, Foreman JP & Rodenburg C (2017) Low-Voltage SEM of Natural Plant Fibers: Microstructure Properties (Surface and Cross-Section) and their Link to the Tensile Properties. Procedia Engineering, Vol. 200 (pp 295-302) View this article in WRRO
Almansoori A, Seabright R, Majewski C & Rodenburg C (2017) Feasibility of Plasma Treated Clay in Clay/Polymer Nanocomposites Powders for use Laser Sintering (LS). IOP Conference Series: Materials Science and Engineering, Vol. 195 (pp 012003-012003) View this article in WRRO
Rodenburg C, Masters R, Lidzey D, Uncovsky M, Vystavel T & Mika F (2016) SECONDARY ELECTRON SPECTROSCOPY AND ENERGY SELECTIVE IMAGING FOR THE ENGINEERING OF CARBON BASED MATERIALS. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 58-59)
Masters RC, Wan Q, Zhou Y, Sandu AM, Dapor M, Zhang H, Lidzey DG & Rodenburg C (2015) Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies. Journal of Physics: Conference Series, Vol. 644 (pp 012017-012017) View this article in WRRO
Wan Q, Plenderleith RA, Dapor M, Rimmer S, Claeyssens F & Rodenburg C (2015) Separating topographical and chemical analysis of nanostructure of polymer composite in low voltage SEM. Journal of Physics: Conference Series, Vol. 644 (pp 012018-012018) View this article in WRRO
Rodenburg C, Pearson A, Lidzey D & Bagnall D (2011) Helium Ion Microscopy to Study Bulk Hetero Junction Polymer Solar Cell Materials
Rodenburg C, Pearson A & Boden S (2011) Energy Selective Secondary Electron Detection in SEM for the Characterization of Polymers
Rodenburg C, Jepson MAE, Bosch EGT & Dapor M (2010) ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 59-60)
Jepson MAE, Khan K, Hayward TJ, Inkson BJ & Rodenburg C (2010) The Effect of Oxidation and Carbon Contamination on SEM Dopant Contrast. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
Inkson BJ, Liu X, Peng Y, Jepson MAE & Rodenburg C (2010) Comparison of multilayered nanowire imaging by SEM and Helium Ion Microscopy. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
Rodenburg C, Jepson MAE, Inkson BJ, Bosch EGT & Humphreys CJ (2010) Energy Filtered Scanning Electron Microscopy: applications to characterisation of semiconductors. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
Rodenburg C, Jepson MAE, Inkson BJ & Liu X (2010) Dopant Contrast in the Helium Ion Microscope: Contrast Mechanism. ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
Chee KWA, Rodenburg C & Humphreys CJ (2008) Quantitative Dopant Profiling in the SEM Including Surface States. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 407-410)
Chee KWA, Rodenburg C & Humphreys CJ (2008) High resolution dopant profiling in the SEM, image widths and surface band-bending - art. no. 012033. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12033-12033)
Kazemian P, Rodenburg C & Humphreys CJ (2004) Effect of experimental parameters on doping contrast of Si p-n junctions in a FEG-SEM. MICROELECTRONIC ENGINEERING, Vol. 73-74 (pp 948-953)
Kazemian P, Schonjahn C & Humphreys CJ (2003) Quantitative doping contrast profiling of p-n junctions in Si with the scanning electron microscope. MICROSCOPY OF SEMICONDUCTING MATERIALS 2003(180) (pp 593-596)
Meidia H, Cullis AG, Schonjahn C, Munz WD & Rodenburg JM (2002) Investigation of intermixing in TiAlN/VN nanoscale multilayer coatings by energy-filtered TEM. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 209-213)
Schonjahn C, Paritong H, Munz WD, Twesten RD & Petrov I (2001) Influence of the interface composition on the corrosion behavior of unbalanced magnetron grown niobium coatings on steel. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 19(4) (pp 1392-1398)
Schonjahn C, Ehlasarian AP, Lewis DB, New R, Munz WD, Twesten RD & Petrov I (2001) Optimization of in situ substrate surface treatment in a cathodic arc plasma: A study by TEM and plasma diagnostics. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 19(4) (pp 1415-1420)
Schonjahn C, Donohue LA, Lewis DB, Munz WD, Twesten RD & Petrov I (2000) Enhanced adhesion through local epitaxy of transition-metal nitride coatings on ferritic steel promoted by metal ion etching in a combined cathodic arc/unbalanced magnetron deposition system. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18(4) (pp 1718-1723)
Schonjahn C, Bamford M, Donohue LA, Lewis DB, Forder S & Munz WD (2000) The interface between TiAlN hard coatings and steel substrates generated by high energetic Cr+ bombardment. SURFACE & COATINGS TECHNOLOGY, Vol. 125(1-3) (pp 66-70)
Munz WD, Schonjahn C, Paritong H & Smith IJ (2000) Hard coatings deposited by combined cathodic arc evaporation and magnetron sputtering (arc bond sputtering : ABS). VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, Vol. 55(297) (pp 205-223)
Schonjahn C, Paritong H, Donohue LA, Munz WD, Twesten RD & Petrov I (1999) Influence of Cr+ and Nb+ substrate sputter cleaning on the formation of Ti1-xAlxN/steel interfaces generated in a combined cathodic arc/unbalanced magnetron deposition system. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 75-78)
Barbe J, Kumar V, Newman M, Lee H, Jain S, Chen H, Charbonneau C, Rodenburg C & Tsoi C () Origin of dark electrical bias-induced degradation of inverted methylammonium lead iodide perovskite solar cells. Proceedings of the 2nd Asia-Pacific Hybrid and Organic Photovoltaics, 28 January 2018 - 30 January 2018.

Software / Code

Stehling N, Chengge J, Abrams K & Rodenburg C Automatic iFAST Spectral Acquisition (Step 0.6V Range-15-20.4 V).

Datasets

Kumar V, Schmidt WL, Masters RC, Wong-Stringer M, Sinclair DC, Reaney IM, Lidzey D & Rodenburg C Datasheets for figures in "Nano-Scale Mapping of Bromide segregation on Cross-sections of Complex Hybrid Perovskite Photovoltaic Films Using Secondary Electron Hyperspectral Imaging in The Scanning Electron Microscope".
Wan Q, Masters R, Lidzey D, Abrams K, Dapor M, Plenderleith RA, Rimmer S, Claeyssens F & Rodenburg C Dataset of figures presented in "Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers" in Ultramicroscopy.

Research group

Research associates:

Dr Vikas Kumar: Novel Electron microscopy methods for complex organic-inorganic hybrid systems
Dr Kerry Abrams: Novel Electron microscopy methods for complex polymers

PhD students:

Alaa Almansoori: Novel polymer composites
Sameer Hamad: Enhancing mechanical properties of nano-structured materials through the use of low energy electron and/or ion beams
Nicola Stehling: Electron microscopy natural materials

Professional activities

12 invited presentations since 2009, including Microscopy and Microanalysis Meeting 2010 (Portland, USA) and 2011(Nashville, USA), Recent trends in Charged Particle Optics and Surface Physics Instrumentation 2010 and 2016, Slavski Davur, Czech Republic
Member of IOP and VDI
Member of the Institute of Physics Electron Microscopy and Analysis Group Committee