Professor John David
PhD, BEng
School of Electrical and Electronic Engineering
Personal Chair
+44 114 222 5185
Full contact details
School of Electrical and Electronic Engineering
- Profile
-
I obtained my BEng and PhD degrees in Electronic Engineering from the University of Sheffield in 1979 and 1983, respectively.
After that, I undertook a number of postdoctoral positions within the Department of Electronic & Electrical Engineering at Sheffield eventually managing the characterisation activities of the SERC Centre for III–V Semiconductors.
In 2001 I left to join Marconi Optical Components, Caswell before returning the following year as a Senior Lecturer.
In 2004 I became Professor of Semiconductor Materials and Devices, and between 2009 to 2013 served as Head of Department. Between 2002 -2004 I was a IEEE LEOS Distinguished Lecturer and I am currently a Fellow of the IEEE and IET.
My research is focussed in two areas;
on the characterisation of III-V semiconductor materials and devices, especially that containing Bismuth and
on the understanding and development of avalanche photodiodes. The addition to Bismuth offers a possible route to extend the wavelength of many optical structures such as photodiodes and solar cells.
I use characterisation techniques such as X-ray double crystal diffraction and photoluminescence to study semiconductor structures containing bulk and quantum wells of GaAsBi and , and then correlate this to current-voltage, capacitance-voltage and photocurrent spectra of fabricated devices.
I also study how under very high electric-fields, electrons and holes in a semiconductor gain energy and create further carriers through a process of impact ionisation. This process can lead to destructive breakdown in power electronic devices but can also be utilised to amplify weak optical signals, giving rise to avalanche photodiodes (APDs).
I study the theory behind the ionisation process via different modelling techniques and also look experimentally at the ionisation coefficients in different semiconductor materials and device structures.
The aim of my research is to develop APDs capable of operating at very high speeds for next generation telecommunication networks and also APDs that are very sensitive.
- Qualifications
-
- PhD (Semiconductors), University of Sheffield 1983
- BEng (Electronics), University of Sheffield 1976
- Research interests
-
- -Impact Ionisation and breakdown in semiconductors
- Photodiode and avalanche photodiodes
- Bismuth containing alloys
- Publications
-
Journal articles
- Capacitance-voltage characterization of GaAsBi/GaAs multiple quantum wells grown by molecular beam epitaxy. Journal of Physics: Conference Series, 3020. View this article in WRRO
- High-performance room temperature 2.75 µm cutoff In0.22Ga0.78As0.19Sb0.81/Al0.9Ga0.1As0.08Sb0.92 avalanche photodiode. Optica, 11(12), 1632-1638. View this article in WRRO
- Electroabsorption in InGaAs and GaAsSb p-i-n photodiodes. Applied Physics Letters, 125(22). View this article in WRRO
- (Invited) Pseudo-Planar Ge-on-Si Avalanche Photodiodes in Geiger and Linear Modes for Short-Wave Infrared Detection. ECS Meeting Abstracts, MA2024-02(32), 2330-2330.
- Engineering of impact ionization characteristics in GaAs/GaAsBi multiple quantum well avalanche photodiodes. ACS Photonics, 11(11), 4846-4853. View this article in WRRO
- Low excess noise and high quantum efficiency avalanche photodiodes for beyond 2 µm wavelength detection. Communications Materials, 5(1). View this article in WRRO
- Impact ionization coefficients and excess noise in Al0.55Ga0.45As0.56Sb0.44 lattice matched to InP. Applied Physics Letters, 124(25). View this article in WRRO
- Surface-normal illuminated pseudo-planar Ge-on-Si avalanche photodiodes with high gain and low noise. Optics Express, 32(11). View this article in WRRO
- Ionization coefficients and excess noise characteristics of AlInAsSb on an InP substrate. Applied Physics Letters, 123(13).
- Very low excess noise Al0.75Ga0.25As0.56Sb0.44 avalanche photodiode. Optics Express, 31(20), 33141-33149. View this article in WRRO
- Negative thermal quenching in optically pumped GaAsBi–GaAs heterojunction p–i–n diode. Applied Physics A, 129(8).
- Sb-based low-noise avalanche photodiodes. Photonics, 10(7). View this article in WRRO
- Anomalous excess noise behavior in thick Al0.85Ga0.15As0.56Sb0.44 avalanche photodiodes.. Scientific Reports, 13. View this article in WRRO
- High electric field characteristics of GaAsSb photodiodes on InP substrates. Applied Physics Letters, 122(22). View this article in WRRO
- Vector coding optical wireless links. Journal of Lightwave Technology, 41(17), 5577-5587. View this article in WRRO
- Effect of bismuth incorporation on recombination mechanisms in GaAsBi/GaAs heterostructures. Journal of Materials Science: Materials in Electronics, 34(6).
- High gain, low noise 1550 nm GaAsSb/AlGaAsSb avalanche photodiodes. Optica, 10(2). View this article in WRRO
- Deriving the absorption coefficients of lattice mismatched InGaAs using genetic algorithm. Materials Science in Semiconductor Processing, 153, 107135-107135.
- Optimized multi-primary modulation for visible light communication. Journal of Lightwave Technology, 40(22), 7254-7264. View this article in WRRO
- Absorption Coefficient of Bulk III-V Semiconductor Materials: A Review on Methods, Properties and Future Prospects. Journal of Electronic Materials, 51(11), 6082-6107.
- Growth of GaAsBi/GaAs multiple quantum wells with up to 120 periods. Journal of Crystal Growth, 589. View this article in WRRO
- Growth of InAs(Bi)/GaAs quantum dots under a bismuth surfactant at high and low temperature. Journal of Nanomaterials, 2022. View this article in WRRO
- Impact Ionization Coefficients of Digital Alloy and Random Alloy Al0.85Ga0.15As0.56Sb0.44 in a Wide Electric Field Range. Journal of Lightwave Technology, 40(14), 4758-4764.
- Effect of MBE growth conditions on GaAsBi photoluminescence lineshape and localised state filling.. Scientific Reports, 12. View this article in WRRO
- Weibull-Fréchet random path length model for avalanche gain and noise in photodiodes. Journal of Physics D: Applied Physics, 55(6), 065105-065105.
- Temperature Dependence of the Impact Ionization Coefficients in AlAsSb Lattice Matched to InP. IEEE Journal of Selected Topics in Quantum Electronics, 28(2: Optical Detectors), 1-8.
- Valence band engineering of GaAsBi for low noise avalanche photodiodes. Nature Communications, 12(1). View this article in WRRO
- Impact Ionization Coefficients in (Al
x
Ga1-x
)0.52In0.48P and Al
x
Ga1-x
As Lattice-Matched to GaAs. IEEE Transactions on Electron Devices, 68(8), 4045-4050.
- Temperature and band gap dependence of GaAsBi p-i-n diode current–voltage behaviour. Journal of Physics D: Applied Physics, 54(19). View this article in WRRO
- Multi-dimensional optimization of In0.53Ga0.47As thermophotovoltaic cell using real coded genetic algorithm. Scientific Reports, 11(1). View this article in WRRO
- Theoretical Analysis of AlAs₀.₅₆Sb₀.₄₄ Single Photon Avalanche Diodes With High Breakdown Probability. IEEE Journal of Quantum Electronics, 57(2), 1-6.
- Photoluminescence and Raman Scattering of GaAs1-xBix Alloy. Sains Malaysiana, 49(10), 2559-2564.
- Electrical and optical characterisation of low temperature grown InGaAs for photodiode applications. Semiconductor Science and Technology, 35(9). View this article in WRRO
- Extremely low excess noise and high sensitivity AlAs0.56Sb0.44 avalanche photodiodes. Nature Photonics, 13(10), 683-686. View this article in WRRO
- Modelling of bismuth segregation in InAsBi/InAs superlattices: Determination of the exchange energies. Applied Surface Science, 485, 29-34. View this article in WRRO
- Exact Analytical Formula for the Excess Noise Factor for Mixed Carrier Injection Avalanche Photodiodes. Journal of Lightwave Technology, 37(13), 3315-3323.
- Coded color shift keying with frequency domain equalization for low complexity energy efficient indoor visible light communications. Physical Communication, 31, 160-168.
- Light-biased IV characteristics of a GaAsBi/GaAs multiple quantum well pin diode at low temperature. Semiconductor Science and Technology, 33(9). View this article in WRRO
- Demonstration of large ionization coefficient ratio in AlAs0.56Sb0.44 lattice matched to InP. Scientific Reports, 8(1).
- An excess noise measurement system for weak responsivity avalanche photodiodes. Measurement Science and Technology, 29(6). View this article in WRRO
- Assessing the Nature of the Distribution of Localised States in Bulk GaAsBi.. Scientific Reports, 8(1). View this article in WRRO
- Guest Editorial: Introduction to the Special Issue on Optical Detectors. IEEE Journal of Selected Topics in Quantum Electronics, 24(2), 1-3.
- Photovoltaic characterisation of GaAsBi/GaAs multiple quantum well devices. Solar Energy Materials and Solar Cells, 172, 238-243. View this article in WRRO
- Low-Noise Speed-Optimized Large Area CMOS Avalanche Photodetector for Visible Light Communication. Journal of Lightwave Technology, 35(11), 2315-2324.
- Absorption coefficients in AlGaInP lattice-matched to GaAs. Solar Energy Materials and Solar Cells, 164, 28-31. View this article in WRRO
- InAs/InAsP Core/shell Nanowire Photodiode on a Si Substrate. Nano Advances.
- On the analytical formulation of excess noise in avalanche photodiodes with dead space. Optics Express, 24(19), 21597-21608. View this article in WRRO
- Avalanche breakdown characteristics of Al1-xGaxAs0.56Sb0.44 quaternary alloys. IEEE Photonics Technology Letters, 28(22), 2495-2498. View this article in WRRO
- Optical and spin properties of localized and free excitons in GaBi ₓAs₁-ₓ /GaAs multiple quantum wells. Journal of Physics D: Applied Physics, 49(35). View this article in WRRO
- The staircase photodiode. Nature Photonics, 10(6), 364-366.
- Al0.52In0.48P avalanche photodiodes for soft X-ray spectroscopy. Journal of Instrumentation, 11(3). View this article in WRRO
- High-Gain InAs Planar Avalanche Photodiodes. Journal of Lightwave Technology, 34(11). View this article in WRRO
- Avalanche Noise in Al0.52In0.48P Diodes. IEEE Photonics Technology Letters, 28(4), 481-484. View this article in WRRO
- Determination of absorption coefficients in AlInP lattice matched to GaAs. Journal of Physics D: Applied Physics, 48(40). View this article in WRRO
- Requirements for a GaAsBi 1 eV sub-cell in a GaAs-based multi-junction solar cell. Semiconductor Science and Technology, 30(9), 094010-094010.
- InAs Diodes Fabricated Using Be Ion Implantation. IEEE Transactions on Electron Devices, 62(9), 2928-2932. View this article in WRRO
- MBE grown GaAsBi/GaAs multiple quantum well structures: Structural and optical characterization. Journal of Crystal Growth, 425, 237-240. View this article in WRRO
- Bismuth concentration inhomogeneity in GaAsBi bulk and quantum well structures. Semiconductor Science and Technology, 30(9), 094018-094018.
- Growth and structural characterization of GaAsBi/GaAs multiple quantum wells. Semiconductor Science and Technology, 30(9), 094013-094013.
- Optical properties of GaAsBi/GaAs quantum wells: Photoreflectance, photoluminescence and time-resolved photoluminescence study. Semiconductor Science and Technology, 30(9), 094005-094005.
- Absorption properties of GaAsBi based p–i–n heterojunction diodes. Semiconductor Science and Technology, 30(9), 094004-094004.
- Relating the Experimental Ionization Coefficients in Semiconductors to the Nonlocal Ionization Coefficients. IEEE Transactions on Electron Devices, 62(6), 1946-1952.
- InAs/GaSb Type-II Superlattice for Radiation Thermometry. IEEE Transactions on Instrumentation and Measurement, 64(2), 502-508.
- Experimental and theoretical studies of band gap alignment in GaAs1−xBix/GaAs quantum wells. Journal of Applied Physics, 116(23).
- 1550 nm InGaAs/InAlAs single photon avalanche diode at room temperature. Optics Express, 22(19), 22608-22615. View this article in WRRO
- An Enhanced Colour Shift Keying Modulation Scheme for High Speed Wireless Visible Light Communications. Journal of Lightwave Technology, 32(14), 2582-2592. View this article in WRRO
- Localization effects and band gap of GaAsBi alloys. Physica Status Solidi B Basic Research, 251(6), 1276-1281.
- Demonstration of InAsBi photoresponse beyond 3.5 μ m. Applied Physics Letters, 104(17).
- Al0.52In0.48P SAM-APD as a Blue-Green Detector. IEEE Journal of Selected Topics in Quantum Electronics, 20(6), 142-146.
- GaAs/Al₀.₈Ga₀.₂As avalanche photodiodes for soft X-ray spectroscopy. Journal of Instrumentation, 9.
- Molecular beam epitaxy growth of GaAsBi using As2 and As 4. Journal of Crystal Growth, 390, 120-124.
- An InGaAlAs-InGaAs two-color photodetector for ratio thermometry. IEEE Transactions on Electron Devices, 61(3), 838-843.
- Temperature dependence of avalanche multiplication and breakdown voltage in Al0.52In0.48P. JOURNAL OF APPLIED PHYSICS, 115(6).
- On the Use of Gaussian Approximation in Analyzing the Performance of Optical Receivers. IEEE PHOTONICS JOURNAL, 6(1).
- Bismuth incorporation and the role of ordering in GaAsBi/GaAs structures. Nanoscale Research Letters, 9(1), 1-8.
- Photoluminescence Enhancement of InAs(Bi) Quantum Dots by Bi Clustering. APPLIED PHYSICS EXPRESS, 6(4).
- Formation of Tetragonal InBi Clusters in InAsBi/InAs(100) Heterostructures Grown by Molecular Beam Epitaxy. APPLIED PHYSICS EXPRESS, 6(11).
- Experimental evaluation of impact ionization in dilute nitride GaInNAs diodes. Applied Physics Letters, 103(10).
- Evaluation of InAs quantum dots on Si as optical modulator. Semiconductor Science and Technology, 28(9).
- GaAsBi MQWs for multi-junction photovoltaics. Conference Record of the IEEE Photovoltaic Specialists Conference, 303-305.
- Temperature dependence of gain and excess noise in InAs electron avalanche photodiodes. Optics Express, 20(28), 29568-29576.
- Absorption characteristics of GaAs1?xBix/GaAs diodes in the near-infrared. IEEE Photonics Technology Letters, 24(23), 2191-2194.
- Short-wave infrared GaInAsSb photodiodes grown on GaAs substrates. Proceedings of SPIE the International Society for Optical Engineering, 8541.
- A transimpedance amplifier for excess noise measurements of high junction capacitance avalanche photodiodes. Measurement Science and Technology, 23(12).
- Stability in Small Signal Common Base Amplifiers. IEEE Transactions on Circuits and Systems.
- Effects of rapid thermal annealing on GaAs 1-xBi x alloys. Applied Physics Letters, 101(1).
- 1300 nm wavelength InAs quantum dot photodetector grown on silicon. Optics Express, 20(10), 10446-10452.
- Impact ionization coefficients in 4H-SiC by ultralow excess noise measurement. IEEE Transactions on Electron Devices, 59(4), 1030-1036.
- Investigation of the optical properties of InAs/InGaAs/GaAs quantum dot in quantum well multilayer structures for infrared photodetectors. Journal of Physics Conference Series, 356(1).
- Impact Ionization Coefficients in 4H-SiC by Ultralow Excess Noise Measurement. IEEE Transactions on Electron Devices.
- Effects of dead space on avalanche gain distribution of X-ray avalanche photodiodes. IEEE Transactions on Electron Devices, 59(4), 1063-1067.
- Bi incorporation in GaAs(100)-2×1 and 4×3 reconstructions investigated by RHEED and STM. Journal of Crystal Growth.
- Short-wave infrared GaInAsSb photodiodes grown on GaAs substrate by interfacial misfit array technique. IEEE Photonics Technology Letters, 24(3), 218-220.
- Improved Optoelectronic Properties of Rapid Thermally Annealed Dilute Nitride GaInNAs Photodetectors. Journal of Electronic Materials, 1-9.
- Bi incorporation in GaAs(100)-2×1 and 4×3 reconstructions investigated by RHEED and STM. Journal of Crystal Growth, 341(1), 19-23.
- Low noise high responsivity InAs electron avalanche photodiodes for infrared sensing. Physica Status Solidi C Current Topics in Solid State Physics, 9(2), 310-313.
- Room temperature photoluminescence intensity enhancement in GaAs 1-xBi x alloys. Physica Status Solidi C Current Topics in Solid State Physics, 9(2), 259-261.
- Non-stoichiometric GaAsBi/GaAs (100) molecular beam epitaxy growth. Journal of Crystal Growth.
- Reverse leakage current mechanisms in quantum dot laser structures. 2011 IEEE Regional Symposium on Micro and Nanoelectronics Rsm 2011 Programme and Abstracts, 32-35.
- InAs avalanche photodiodes for X-ray detection. Journal of Instrumentation, 6(12).
- High speed InAs electron avalanche photodiodes overcome the conventional gain-bandwidth product limit.. Opt Express, 19(23), 23341-23349.
- Impact ionization coefficients in Al0.52In0.48P. IEEE Electron Device Letters, 32(11), 1528-1530.
- Impact Ionization Coefficients in Al0.52In0.48P. IEEE Electron Device Letters.
- Temperature Dependence of Leakage Current in InAs Avalanche Photodiodes. IEEE J QUANTUM ELECT, 47(8), 1123-1128.
- The effect of Bi composition to the optical quality of GaAs1-xBix. APPL PHYS LETT, 99(4).
- Effect of modulation p-doping on the optical properties of quantum dot laser structure. Aip Conference Proceedings, 1328, 136-138.
- Dark current mechanisms in quantum dot laser structures. J APPL PHYS, 109(11).
- GaInNAsSb/GaAs Photodiodes for Long-Wavelength Applications. IEEE ELECTR DEVICE L, 32(7), 919-921.
- Avalanche Multiplication and Excess Noise in InAs Electron Avalanche Photodiodes at 77 K. IEEE J QUANTUM ELECT, 47(6), 858-864.
- Implementation of an algorithmic spectrometer using Quantum Dot Infrared Photodetectors. Infrared Physics and Technology, 54(3), 228-232.
- Noise, Gain, and Responsivity in Low-Strain Quantum Dot Infrared Photodetectors with up to 80 Dot-in-a-Well Periods. IEEE J QUANTUM ELECT, 47(5), 607-613.
- Avalanche Gain and Energy Resolution of Semiconductor X-ray Detectors. IEEE T ELECTRON DEV, 58(6), 1696-1701.
- Photoluminescence investigation of high quality GaAs1-xBix on GaAs. APPL PHYS LETT, 98(12).
- Sensitivity of high-speed lightwave system receivers using InAlAs avalanche photodiodes. IEEE Photonics Technology Letters, 23(4), 233-235.
- Versatile spectral imaging with an algorithm-based spectrometer using highly tuneable quantum dot infrared photodetectors. IEEE Journal of Quantum Electronics, 47(2), 190-197.
- Development of high temperature AlGaAs soft X-ray photon counting detectors. Journal of Instrumentation, 6(12).
- InAlAs avalanche photodiode with type-II superlattice absorber for detection beyond 2 μm. IEEE Transactions on Electron Devices, 58(2), 486-489.
- Dark current mechanism in bulk GaInNAs lattice matched to GaAs. IEEE Transactions on Electron Devices, 58(1), 103-106.
- Electroluminescence studies of modulation p-doped quantum dot laser structures. IEEE Journal of Quantum Electronics, 46(12), 1847-1853.
- Impact ionization in InAs electron avalanche photodiodes. IEEE Transactions on Electron Devices, 57(10), 2631-2638.
- Temperature dependence of AlGaAs soft X-ray detectors. NUCL INSTRUM METH A, 621(1-3), 453-455.
- Nonlocal impact ionization and avalanche multiplication. Journal of Physics D Applied Physics, 43(24).
- Temperature Dependence of Avalanche Breakdown in InP and InAlAs. IEEE J QUANTUM ELECT, 46(8), 1153-1157.
- A Theoretical Comparison of the Breakdown Behavior of In0.52Al0.48As and InP Near-Infrared Single-Photon Avalanche Photodiodes. IEEE J QUANTUM ELECT, 45(5-6), 566-571.
- Correlation between defect density and current leakage in InAs/GaAs quantum dot-in-well structures. J APPL PHYS, 106(2).
- Optimization of InP APDs for High-Speed Lightwave Systems. J LIGHTWAVE TECHNOL, 27(15), 3294-3302.
- Extremely Low Excess Noise in InAs Electron Avalanche Photodiodes. IEEE PHOTONIC TECH L, 21(13), 866-868.
- Dependence of the Electroluminescence on the Spacer Layer Growth Temperature of Multilayer Quantum-Dot Laser Structures. IEEE J QUANTUM ELECT, 45(1-2), 79-85.
- Impact ionization in ion implanted 4H-SiC photodiodes. Materials Research Society Symposium Proceedings, 1069, 245-250.
- Quantum dots in strained layers-preventing relaxation through the precipitate hardening effect. Journal of Applied Physics, 104(12).
- Avalanche noise characteristics in submicron InP diodes. IEEE J QUANTUM ELECT, 44(3-4), 378-382.
- Electron dominated impact ionization and avalanche gain characteristics in InAs photodiodes. APPL PHYS LETT, 93(11).
- AlGaAs diodes for X-ray spectroscopy. NUCL INSTRUM METH A, 594(2), 202-205.
- Impact ionization coefficients in 4H-SiC. IEEE T ELECTRON DEV, 55(8), 1984-1990.
- Modeling of avalanche multiplication and excess noise factor in In0.52Al0.48As avalanche photodiodes using a simple Monte Carlo model. J APPL PHYS, 104(1).
- Material considerations for avalanche photodiodes (Invited paper). IEEE J SEL TOP QUANT, 14(4), 998-1009.
- Single-photon avalanche diode detectors for quantum key distribution. IET OPTOELECTRONICS, 1(6), 249-254.
- Effects of Ionization Velocity and Dead Space on Avalanche Photodiode Bit Error Rate.. IEEE Trans. Commun., 55, 2033-2033.
- Stark shift of the spectral response in quantum dots-in-a-well infrared photodetectors. J PHYS D APPL PHYS, 40(18), 5537-5540.
- Effect of dead space on low-field avalanche multiplication in InP. IEEE T ELECTRON DEV, 54(8), 2051-2054.
- Statistics of avalanche current buildup time in single-photon avalanche diodes. IEEE J SEL TOP QUANT, 13(4), 906-910.
- Excess avalanche noise in In0.52Al0.48As. IEEE J QUANTUM ELECT, 43(5-6), 503-507.
- Long wavelength bulk GaInNAs p-i-n photodiodes lattice matched to GaAs. J APPL PHYS, 101(6).
- Double transit region Gunn diodes. SEMICOND SCI TECH, 22(3), 245-248.
- Effects of dead space on breakdown probability in Geiger mode avalanche photodiode. J MOD OPTIC, 54(2-3), 353-360.
- Effects of ionization velocity and dead space on avalanche photodiode bit error rate. IEEE T COMMUN, 55(11), 2152-2158.
- Capacitive quenching measurement circuit for Geiger-mode avalanche photodiodes. IEEE J SEL TOP QUANT, 13(4), 919-925.
- Avalanche multiplication in InAlAs. IEEE T ELECTRON DEV, 54(1), 11-16.
- Design, fabrication and characterisation of InGaAs/InP single-photon
avalanche diode detectors.
- Photoluminescence beyond 1.5 mu m from InAs quantum dots. MICROELECTRONICS JOURNAL, 37(12), 1468-1470.
- Excess noise measurement in avalanche photodiodes using a transimpedance amplifier front-end. MEAS SCI TECHNOL, 17(7), 1941-1946.
- Design and performance of an InGaAs-InP single-photon avalanche diode detector. IEEE J QUANTUM ELECT, 42(3-4), 397-403.
- Room-temperature 1.6 mu m light emission from InAs/GaAs quantum dots with a thin GaAsSb cap layer. J APPL PHYS, 99(4).
- Optical properties of AlGaN/GaN multiple quantum well structure by using a high-temperature AlN buffer on sapphire substrate. J APPL PHYS, 99(2).
- A physics-based model to predict bit error rate of an optical telecommunication system incorporating an avalanche photodiode that includes the effects of dead space and finite carrier velocity. Conference Proceedings Lasers and Electro Optics Society Annual Meeting LEOS, 859-860.
- Temperature dependence of impact ionization in submicrometer silicon devices. IEEE Transactions on Electron Devices, 53(9), 2328-2334.
- Low noise avalanche photodiodes. Conference Proceedings Lasers and Electro Optics Society Annual Meeting LEOS, 2005, 369-370.
- Excess noise measurement in In0.53Ga0.47As. IEEE PHOTONIC TECH L, 17(11), 2412-2414.
- Effect of impact ionization in the InGaAs absorber on excess noise of avalanche photodiodes. IEEE J QUANTUM ELECT, 41(8), 1092-1096.
- Exponential time response in analogue and Geiger mode avalanche photodiodes. IEEE T ELECTRON DEV, 52(7), 1527-1534.
- Effect of strain relaxation and exciton localization on performance of 350-nm AlInGaN quaternary light-emitting diodes. J APPL PHYS, 97(8).
- Enhanced optical and structural properties of 1.3 mu m GaInNAs/GaAs multiple quantum-well heterostructures with stepped strain-mediating layers. APPL PHYS LETT, 86(6).
- Temperature dependence of avalanche multiplication in submicron silicon devices. Proceedings of Essderc 2005 35th European Solid State Device Research Conference, 2005, 245-248.
- Avalanche noise characteristics of single AlxGa1-xAs(0.3 < x < 0.6)-GaAs heterojunction APDs. IEEE J QUANTUM ELECT, 41(1), 70-75.
- Establishing MOVPE growth of InAs/GaAs quantum dots in a commercial 8×3″ multiwafer reactor for optoelectronic applications. Design and Nature, 6, 107-110.
- Gain dependent avalanche duration and gain×bandwidth product in an avalanche photodiode. Proceedings of the 4th International Conference on Numerical Simulation of Optoelectronic Devices Nusod 04, 30-31.
- Temperature dependence of breakdown voltage in AlxGa 1-xAs. Journal of Applied Physics, 96(9), 5017-5019.
- Excess noise characteristics of single heterojunction AlxGa 1-xAs-GaAs avalanche photodiodes. Proceedings of SPIE the International Society for Optical Engineering, 5451, 426-433.
- Influences of the spacer layer growth temperature on multilayer InAs/GaAs quantum dot structures. J APPL PHYS, 96(4), 1988-1992.
- Improved performance of 1.3 mu m multilayer InAs quantum-dot lasers using a high-growth-temperature GaAs spacer layer. APPL PHYS LETT, 85(5), 704-706.
- Modeling of avalanche multiplication and noise in heterojunction avalanche photodiodes. Journal of Applied Physics, 95(11 I), 6245-6251.
- Impact ionization in submicron silicon devices. J APPL PHYS, 95(10), 5931-5933.
- Enhanced carrier velocity to early impact ionization. Journal of Applied Physics, 95(7), 3561-3564.
- Temperature dependence of electron impact ionization in In0.53Ga0.47As. APPL PHYS LETT, 84(13), 2322-2324.
- Growth, Fabrication, and Operating Characteristics of Ultra-Low Threshold 1.31μm Quantum Dot Lasers. Extended Abstracts of the 2004 International Conference on Solid State Devices and Materials.
- Improving optical properties of 1.55 mu m GaInNAs/GaAs multiple quantum wells with Ga(In)NAs barrier and space layer. APPL PHYS LETT, 83(24), 4951-4953.
- Low Noise Avalanche Photodiodes. Conference on Optical Fiber Communication Technical Digest Series, 86, 336-337.
- Effect of temperature on the avalanche properties of sub-micron structures. Institute of Physics Conference Series, 174, 263-266.
- Temperature dependent low-field electron multiplication in In0.53Ga0.47As. APPL PHYS LETT, 83(14), 2820-2822.
- Temperature dependence of impact ionization in GaAs. IEEE Transactions on Electron Devices, 50(10), 2027-2031.
- Temperature dependence of breakdown and avalanche multiplication in In0.53Ga0.47As diodes and heterojunction bipolar transistors. IEEE T ELECTRON DEV, 50(10), 2021-2026.
- Multiplication and excess noise in AlxGa1-xAs/GaAs multilayer avalanche photodiodes. J APPL PHYS, 94(4), 2631-2637.
- Nonlocal effects in thin 4H-SiC UV avalanche photodiodes. IEEE T ELECTRON DEV, 50(8), 1724-1732.
- Why small avalanche photodiodes are beautiful. Proceedings of SPIE the International Society for Optical Engineering, 4999, 349-362.
- The effect of dead space on gain and excess noise in In0.48Ga0.52P p(+)in(+) diodes. SEMICOND SCI TECH, 18(8), 803-806.
- The effect of ionization threshold softness on the temperature dependence of the impact ionization coefficient. Semiconductor Science and Technology, 18(7), 689-692.
- Time response modelling in submicron avalanche photodiodes. IEE Proceedings Optoelectronics, 150(2), 167-170.
- Avalanche speed in thin avalanche photodiodes. Journal of Applied Physics, 93(7), 4232-4239.
- Field dependence of impact ionization coefficients in In0.53Ga0.47As. IEEE T ELECTRON DEV, 50(4), 901-905.
- Performance of thin 4H-SiC UV avalanche photodiodes. IEE PROCEEDINGS-OPTOELECTRONICS, 150(2), 187-190.
- Negative temperature dependence of electron multiplication in In0.53Ga0.47As. APPL PHYS LETT, 82(8), 1224-1226.
- The effects of nonlocal impact lonization on the speed of avalanche photodiodes. IEEE Transactions on Electron Devices, 50(2), 347-351.
- Demonstration of 4H-SiC avalanche photodiodes linear array. SOLID-STATE ELECTRONICS, 47(2), 241-245.
- Calculation of APD impulse response using a space- and time-dependent ionization probability distribution function. J LIGHTWAVE TECHNOL, 21(1), 155-159.
- Temperature dependence of avalanche multiplication in submicron Al0.6Ga0.4As diodes. J APPL PHYS, 92(12), 7684-7686.
- Non-equilibrium modelling of avalanche photodiode speed. Conference Proceedings Lasers and Electro Optics Society Annual Meeting LEOS, 2, 490-491.
- Avalanche multiplication and breakdown in AlxGa1-xAs (x < 0-9). IEEE T ELECTRON DEV, 49(12), 2349-2351.
- A general method for estimating the duration of avalanche multiplication. SEMICOND SCI TECH, 17(10), 1067-1071.
- Multiplication and excess noise characteristics of thin 4H-SiC UV avalanche photodiodes. IEEE PHOTONIC TECH L, 14(9), 1342-1344.
- Fokker-Planck approach to impact ionization distributions in space and time. Journal of Applied Physics, 91(8), 5438-5441.
- Avalanche breakdown voltage of In0.53Ga0.47As. J APPL PHYS, 91(8), 5200-5202.
- Effect of dead space on avalanche speed. IEEE T ELECTRON DEV, 49(4), 544-549.
- Excess noise characteristics of Al0.8Ga0.2As avalanche photodiodes. IEEE PHOTONIC TECH L, 14(4), 522-524.
- Low-noise visible-blind UV avalanche photodiodes with edge terminated by 2 degrees positive bevel. ELECTRON LETT, 38(7), 335-336.
- Simulated current response in avalanche photodiodes. Journal of Applied Physics, 91(3), 2107-2111.
- Measurement of electron saturation velocity in Ga0.52In0.48P in a double heterojunction bipolar transistor. J APPL PHYS, 91(3), 1601-1605.
- GaN Schottky ultraviolet photodetectors using the metal-semiconductor-metal structure. Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications EDMO, 131-136.
- Low noise avalanche photodiodes. Conference Proceedings Lasers and Electro Optics Society Annual Meeting LEOS, 2, 693-694.
- Al0.8Ga0.2As: A very low excess noise multiplication medium for avalanche photodiodes. IEE P-OPTOELECTRON, 148(5-6), 243-246.
- Avalanche multiplication characteristics of Al0.8Ga0.2As diodes. IEEE T ELECTRON DEV, 48(10), 2198-2204.
- Treatment of soft threshold in impact ionization. J APPL PHYS, 90(5), 2538-2543.
- Fokker-Planck model for nonlocal impact ionization in semiconductors. J APPL PHYS, 90(3), 1314-1317.
- Low multiplication noise thin Al0.6Ga0.4As avalanche photodiodes. IEEE T ELECTRON DEV, 48(7), 1310-1317.
- Impact ionization probabilities as functions of two-dimensional space and time. Journal of Applied Physics, 89(5), 2742-2751.
- Impact ionization coefficients of Al0.8Ga0.2As. APPL PHYS LETT, 77(26), 4374-4376.
- The merits and limitations of local impact lonization theory. IEEE Transactions on Electron Devices, 47(5), 1080-1088.
- Avalanche multiplication in AlxGa1-xAs (x = OtoO.60). IEEE Transactions on Electron Devices, 47(5), 1089-1097.
- Avalanche noise characteristics of thin GaAs structures with distributed carrier generation. IEEE T ELECTRON DEV, 47(5), 910-914.
- Avalanche multiplication in submicron AlxGa1-xAs/GaAs multilayer structures. J APPL PHYS, 88(5), 2601-2608.
- Avalanche noise measurement in thin Si p(+)-i-n(+) diodes. APPL PHYS LETT, 76(26), 3926-3928.
- Ionization coefficients in AlxGa1-xAs (x = 0-0.60). Semiconductor Science and Technology, 15(7), 692-699.
- Full band Monte Carlo modeling of impact ionization, avalanche multiplication, and noise in submicron GaAs p+-i-n+ diodes. Journal of Applied Physics, 87(11), 7885-7891.
- Inverted electron-hole alignment in InAs-GaAs self-assembled quantum dots.. Phys Rev Lett, 84(4), 733-736.
- A simple model for avalanche multiplication including deadspace effects. IEEE Transactions on Electron Devices, 46(4), 769-775.
- Intracavity piezoelectric InGaAs/GaAs laser modulator. Proceedings of SPIE the International Society for Optical Engineering, 3896, 163-170.
- The effect of an electric-field gradient on avalanche noise. APPL PHYS LETT, 75(19), 2963-2965.
- Monte Carlo simulation of high-field transport and impact ionization in AlGaAs p+in+ diodes. Semiconductor Science and Technology, 14(11), 994-1000.
- Photoluminescence linewidths of piezoelectric quantum wells. Applied Physics Letters, 75(13), 1929-1931.
- Low avalanche noise characteristics in thin InP p(+)-i-n(+) diodes with electron initiated multiplication. IEEE PHOTONIC TECH L, 11(3), 364-366.
- Piezoelectric InGaAs/AIGaAs laser with intracavity absorber. IEE Proceedings Optoelectronics, 146(1), 62-66.
- Low noise GaAs and Al0.3Ga0.7As avalanche photodetectors. IEE P-OPTOELECTRON, 146(1), 21-24.
- Optical bistability in piezoelectric InGaAs/AlGaAs laser with saturable absorber. Electronics Letters, 35(2), 150-152.
- The influence of trimethylindium impurities on the performance of InAlGaAs single quantum well lasers. Journal of Crystal Growth, 195(1-4), 668-675.
- A monte carlo investigation of multiplication noise in thin p+-i-n+ GaAs avalanche photodiodes. IEEE Transactions on Electron Devices, 45(8), 1804-1810.
- Avalanche multiplication and breakdown in Ga0.52In0.48P diodes. IEEE T ELECTRON DEV, 45(10), 2096-2101.
- Avalanche multiplication noise characteristics in thin GaAs p(+)-i-n(+) diodes. IEEE T ELECTRON DEV, 45(10), 2102-2107.
- Avalanche multiplication in GaInP/GaAs single heterojunction bipolar transistors. IEEE T ELECTRON DEV, 45(6), 1207-1212.
- Impact ionization in AlxGa1-xAs/GaAs single heterostructures. Journal of Applied Physics, 84(8), 4363-4369.
- A simple model to determine multiplication and noise in avalanche photodiodes. Journal of Applied Physics, 83(6), 3426-3428.
- Electrical and optical characterisation of heavily doped GaAs : C bases of heterojunction bipolar transistors. SOLID STATE ELECTRON, 42(1), 115-120.
- Monte Carlo estimation of avalanche noise in thin p+-i-n+ GaAs diodes. Applied Physics Letters, 72(2), 232-234.
- Low excess noise characteristics in thin avalanche region GaAs diodes. ELECTRON LETT, 34(1), 125-126.
- InGaAs/GaAs piezoelectric lasers. Conference on Lasers and Electro Optics Europe Technical Digest, 95.
- Effects of high temperature annealing on the device characteristics of Ga0.52In0.48P/GaAs and Al0.52In0.48P/GaAs heterojunction bipolar transistors. J ELECTRON MATER, 27(1), 17-23.
- Simulation of impact ionization breakdown in MESFETS using Monte Carlo methods. Semiconductor Science and Technology, 12(9), 1147-1153.
- Monte Carlo simulation of impact ionization in photodetectors. Semiconductor Science and Technology, 12(6), 692-697.
- Monte Carlo simulation of impact ionization and current multiplication in short GaAs p+in+ diodes. Semiconductor Science and Technology, 12(1), 111-120.
- Electron multiplication in AlxGa1-xAs/GaAs heterostructures. Applied Physics Letters, 71(26), 3877-3879.
- Spatial limitations to the application of the lucky-drift theory of impact ionization. IEEE Transactions on Electron Devices, 44(4), 659-663.
- Mapping the confined optical field in a microcavity via the emission from a conjugated polymer. APPL PHYS LETT, 71(6), 744-746.
- Impact ionization in thin AlxGa1-xAs (x = 0.15 and 0.30) p-i-n diodes. Journal of Applied Physics, 82(3), 1231-1235.
- Impact ionization coefficients in GaInP p-i-n diodes. APPL PHYS LETT, 70(26), 3567-3569.
- Electrical and optical bistability in InxGa1-xAs-GaAs piezoelectric quantum wells. PHYS REV B, 55(24), 16045-16048.
- Low threshold InGaAs/AlGaAs lasers grown on (111)B GaAs substrate. Electronics Letters, 33(11), 957-958.
- Monte Carlo simulation of impact ionisation in MESFETs. Electronics Letters, 33(7), 639-640.
- Monte Carlo simulation of impact ionisation in photodetectors. Electronics Letters, 33(4), 337-339.
- Influence of ordering on the polarization characteristics of GaInP vertical-cavity surface-emitting lasers. IEEE Photonics Technology Letters, 9(2), 143-145.
- Memory effects on piezoelectric InGaAs/GaAs MQW PIN diodes. Microelectronics Journal, 28(8-10), 757-765.
- Visible (683 to 713 nm) room-temperature AlGaAs vertical cavity surface emitting lasers ( VCSELs). Journal of Crystal Growth, 170(1-4), 399-403.
- Polarisation characteristics of visible VCSELs. Journal of Crystal Growth, 170(1-4), 394-398.
- Breakdown characteristics of (AlxGa1-x)0.52In0.48P p-i-n diodes. IEEE International Conference on Semiconductor Electronics Proceedings ICSE, 256-260.
- Optical properties of MOVPE grown AlxGa1-xAs quantum wells. Journal of Crystal Growth, 170(1-4), 621-625.
- Investigation of band non-parabolicities in strain-balanced GaInAs/GaAlInAs coupled quantum wells. SUPERLATTICE MICROST, 22(4), 517-520.
- Electrical and optical bistability in [111]GaInAs-GaAs piezo-electric quantum wells. SUPERLATTICE MICROST, 21(1), 113-118.
- Photoconductivity studies of InAsP/InP heterostructures in applied magnetic and electric fields. SEMICOND SCI TECH, 11(1), 34-38.
- Study of misfit dislocations by EBIC, CL and HRTEM in GaAs/InGaAs lattice-strained multi-quantum well p-i-n solar cells. Materials Science and Engineering B, 42(1-3), 43-51.
- Monte Carlo simulation of high field transport and impact ionization in GaAs p+in+ diodes. IEEE Transactions on Electron Devices, 43(12), 2303-2305.
- Effect of strain relaxation on forward bias dark currents in GaAs/InGaAs multiquantum well p-i-n diodes. Journal of Applied Physics, 80(10), 5815-5820.
- Optical spectroscopic observation of spontaneous long range ordering in AlGaInP. APPL PHYS LETT, 68(23), 3266-3268.
- Room temperature visible (683-713 nm) all-AlGaAs vertical-cavity surface-emitting lasers (VCSEL's). IEEE Photonics Technology Letters, 8(4), 473-475.
- Partial screening of internal electric fields in strained piezoelectric quantum well lasers: Implications for optoelectronic integration. Applied Physics Letters, 68(12), 1595-1597.
- Polarisation characteristics of InGaAlP/ AlGaAs visible vertical cavity surface emitting lasers. Electronics Letters, 32(6), 559-560.
- Excitation power and barrier width dependence of photoluminescence in piezoelectric multiquantum well p-i-n structures. APPL PHYS LETT, 68(6), 820-822.
- Investigation of impact ionization in thin GaAs diodes. IEEE T ELECTRON DEV, 43(7), 1066-1072.
- Partial screening of internal electric fields in strained piezoelectric quantum well lasers: Implications for optoelectronic integration. Applied Physics Letters, 1595.
- GROWTH OF INASXP1-X/INP MULTIQUANTUM-WELL STRUCTURES BY SOLID SOURCE MOLECULAR-BEAM EPITAXY. J APPL PHYS, 78(5), 3330-3334.
- Effect of misfit dislocations on leakage currents in strained multiquantum well structures. Applied Physics Letters, 67, 906.
- Avalanche breakdown in AlxGa1-xAs alloys and Al0.3Ga0.7As/GaAs multilayers. Applied Physics Letters, 2876.
- InxGa1-xAs/InP multiquantum well structures grown on [111]B InP substrates. Conference Proceedings International Conference on Indium Phosphide and Related Materials, 299-302.
- InxGa1-xAs/InP quantum well structures grown on [111]B InP. MICROELECTR J, 26(8), 805-810.
- Growth of pseudomorphic InGaAs/GaAs quantum wells on [111]B GaAs for strained layer, piezoelectric, optoelectronic devices. MICROELECTR J, 26(8), 811-820.
- HIGH-PURITY ALGAAS FROM METHYL-BASED PRECURSORS USING IN-SITU GETTERING OF ALKOXIDES. J CRYST GROWTH, 145(1-4), 968-969.
- Room- and low-temperature assessment of pseudomorphic AlGaAs/InGaAs/GaAs high-electron-mobility transistor structures by photoluminescence spectroscopy. Journal of Applied Physics, 76(10), 5931-5944.
- CARRIER SCREENING EFFECTS IN PIEZOELECTRIC STRAINED INGAAS/GAAS QUANTUM-WELLS GROWN ON THE [111]B AXIS. J APPL PHYS, 76(9), 5447-5452.
- High purity AlGaAs from methyl-based precursors using in situ gettering of alkoxides. Journal of Crystal Growth, 143(3-4), 135-140.
- ELECTROABSORPTION MODULATION IN STRAINED PIEZOELECTRIC INGAAS/INP MULTIQUANTUM WELLS OPERATING AT LAMBDA-SIMILAR-OR-EQUAL-TO-1.55 MU-M. ELECTRON LETT, 30(20), 1707-1708.
- All-optical bistable switching in a strained piezoelectric self-electro-optic effect device. Electronics Letters, 30(18), 1521-1522.
- GROWTH AND CHARACTERIZATION OF (111)B INGAAS/GAAS MULTIQUANTUM-WELL PIN DIODE STRUCTURES. J ELECTRON MATER, 23(9), 975-982.
- Plastic relaxation of metamorphic single layer and multilayer InGaAs/GaAs structures. Applied Physics Letters, 65(7), 839-841.
- ELECTRONIC BAND-STRUCTURE OF ALGAINP GROWN BY SOLID-SOURCE MOLECULAR-BEAM EPITAXY. APPL PHYS LETT, 65(2), 213-215.
- ELECTROLUMINESCENCE FROM INGAAS/INALAS HEMTS. ELECTRON LETT, 30(14), 1181-1183.
- AVALANCHE BREAKDOWN IN (AL(X)GA(1X))0.52IN0.48P PIN JUNCTIONS. ELECTRON LETT, 30(11), 907-909.
- SOLID-SOURCE MOLECULAR-BEAM EPITAXY GROWTH OF GAINP AND GAINP-CONTAINING QUANTUM-WELLS. J APPL PHYS, 75(4), 2029-2034.
- Reverse breakdown characteristics in InGa(Al)P/InGaP p-i-n junctions. Conference Proceedings International Conference on Indium Phosphide and Related Materials, 403-406.
- OPTICAL SPECTROSCOPY OF ALGAINP BASED WIDE-BAND GAP QUANTUM-WELLS. SUPERLATTICE MICROST, 15(3), 313-316.
- Piezoelectric-field effects on transition energies, oscillator strengths, and level widths in (111)B-grown (In,Ga)As/GaAs multiple quantum wells.. Phys Rev B Condens Matter, 48(11), 8491-8494.
- TAILORING OF INTERNAL FIELDS IN INGAAS/GAAS MULTIWELL STRUCTURES GROWN ON (111)B GAAS. APPL PHYS LETT, 63(6), 752-754.
- PHOTOLUMINESCENCE, PHOTOLUMINESCENCE EXCITATION, AND RESONANT RAMAN-SPECTROSCOPY OF DISORDERED AND ORDERED GA0.52IN0.48P. J APPL PHYS, 73(10), 5163-5172.
- Growth and characterisation of InAsP/InP SQW and MQW PIN diode structures. 1993 IEEE 5th International Conference on Indium Phosphide and Related Materials, 167-170.
- High performance microcavity resonator devices grown by atmospheric pressure MOVPE. Journal of Crystal Growth, 124(1-4), 792-800.
- Enhanced breakdown voltages in strained InGaAs/GaAs structures. Applied Physics Letters, 61(17), 2042-2044.
- Photoluminescence characterization of gated pseudomorphic AlGaAs/InGaAs/GaAs modulation-doped field-effect transistors. Applied Physics Letters, 61(10), 1225-1227.
- DETERMINATION OF LOW-TEMPERATURE IMPACT IONIZATION COEFFICIENTS IN GAAS BY ELECTROLUMINESCENCE MEASUREMENTS ON SINGLE BARRIER TUNNELING STRUCTURES. APPL PHYS LETT, 61(7), 825-827.
- GROWTH OF STRAINED INAS/INP QUANTUM-WELLS BY MOLECULAR-BEAM EPITAXY. APPL PHYS LETT, 60(7), 841-843.
- IMPACT IONIZATION AND ELECTROLUMINESCENCE IN SINGLE BARRIER TUNNELING STRUCTURES. SUPERLATTICE MICROST, 12(4), 443-446.
- Barrier width dependence of leakage currents in InGaAs/ GaAs multiple quantum well P-I-N diodes. Journal of Electronic Materials, 20(4), 295-297.
- ALGAAS/GAAS P-MODFET MATERIALS GROWN USING INTRINSIC CARBON DOPING. JOURNAL OF CRYSTAL GROWTH, 107(1-4), 915-920.
- Low Voltage Strained Layer Asymmetric Fabry-Perot Reflection Modulator. Electronics Letters, 26(25), 2117-2118.
- LOW LEAKAGE INGAAS/GAAS STRAINED LAYER MQWPIN STRUCTURES. J ELECTRON MATER, 19(7), 56-56.
- Carrier decay in GaAs quantum wells. Applied Physics Letters, 56(3), 268-270.
- MOVPE growth of AlGaAs using trimethylamine alane. Journal of Crystal Growth, 104(4), 857-860.
- Relaxation of strain within multilayer InGaAs/GaAs pseudomorphic structures. Journal of Applied Physics, 66(2), 975-977.
- DISORDERING OF IN0.53GA0.47AS/INP MULTIPLE QUANTUM-WELLS BY SULFUR OR ZINC DIFFUSION AND PROTON-BOMBARDMENT. INST PHYS CONF SER(96), 397-400.
- The Electron Impact Ionization Rate and Breakdown Voltage in GaAs/Ga0.7A10.3As MQW Structures. IEEE Electron Device Letters, 10(7), 294-296.
- On the band gap of InGaAs/GaAs strained quantum wells. Semiconductor Science and Technology, 3(6), 601-604.
- Disordering of ga0.47ln0 53as/lnp multiple quantum well layers by sulphur diffusion. Electronics Letters, 24(19), 1217-1218.
- Diffusion-Induced Disordering of Ga0.47ln0 53As/lnP Multiple Quantum Wells with Zinc. Electronics Letters, 24(15), 910-911.
- GAAS/ALGAAS MULTIPLE QUANTUM WELL PIN DIODES GROWN BY SELECTIVE AREA EPITAXY. ELECTRON LETT, 24(14), 896-898.
- All-optical switching between modes of a GaAs/GaAlAs multiple quantum well waveguide. Applied Physics Letters, 52(24), 2013-2014.
- MOVPE GROWN MQW PIN DIODES FOR ELECTRO-OPTIC MODULATORS AND PHOTODIODES WITH ENHANCED ELECTRON IONIZATION COEFFICIENT. J CRYST GROWTH, 93(1-4), 877-884.
- QUANTUM CONFINED STARK SHIFTS IN MOVPE-GROWN GAAS-ALGAAS MULTIPLE QUANTUM-WELLS. ELECTRON LETT, 23(20), 1048-1050.
- GROWTH AND CHARACTERIZATION OF QUANTUM-WELLS AND SELECTIVELY DOPED HETEROSTRUCTURES OF INP/GA0.47IN0.53AS GROWN BY SOLID SOURCE MBE. J CRYST GROWTH, 81(1-4), 288-295.
- NONLINEAR PROPERTIES OF GaAs/GaAlAs MULTI-QUANTUM-WELL OPTICAL WAVEGUIDES.. IEE Colloquium Digest(1986 /128), 4-8.
- ALL-OPTICAL SWITCHING EFFECTS IN A PASSIVE GAAS/GAALAS MULTIPLE-QUANTUM-WELL WAVE-GUIDE RESONATOR. ELECTRON LETT, 22(21), 1129-1130.
- Improved Molecular Beam Epitaxial Growth Of Inp Using Solid Sources. Electronics Letters, 22(10), 506-507.
- MEASURED IONIZATION COEFFICIENTS IN Ga//1// minus //xAl//xAs.. Institute of Physics Conference Series(74), 247-252.
- IONIZATION COEFFICIENT IN GAAS, DOPING DEPENDENCE. IEE PROC-I, 132(1), 47-47.
- GATE DRAIN AVALANCHE BREAKDOWN IN GAAS POWER MESFETS. IEEE T ELECTRON DEV, 29(10), 1548-1552.
- Opto-Electronic Characterisation of GaAsBi/GaAs Multiple Quantum Wells for Photovoltaic Applications. Solid State Phenomena, 343, 99-104.
Book chapters
- Dilute Bismide Photodetectors, Springer Series in Materials Science (pp. 299-318). Springer Singapore
- Establishing MOVPE growth of InAs/GaAs quantum dots in a commercial 8×3" multiwafer reactor for optoelectronic applications, Microscopy of Semiconducting Materials 2003 (pp. 107-110).
- SEMICONDUCTOR MATERIALS | GaAs Based Compounds, Encyclopedia of Modern Optics (pp. 358-363). Elsevier
- Universal Relation Between Avalanche Breakdown Voltage and Bandstructure in Wide-Gap Semiconductors, Hot Carriers in Semiconductors (pp. 343-346). Springer US
- Microscopy of Semiconducting Materials 2003 CRC Press
Conference proceedings
- Excess noise in AlxGa1-xAs0.56Sb0.44 lattice matched to InP at room temperature. Optical Components and Materials XXII (pp 34-34), 25 January 2025 - 31 January 2025.
- Pseudo-planar Ge-on-Si avalanche photodiode with >100 gain and low excess noise. Optical Components and Materials XXII (pp 19-19), 25 January 2025 - 31 January 2025.
- Development of high-performance short-wave infrared Ge-on-Si linear mode avalanche photodiodes. Silicon Photonics XX (pp 24-24), 25 January 2025 - 31 January 2025.
- Ge-on-Si avalanche photodiodes and single-photon avalanche diode detectors for low-level light detection in the short-wave infrared wavelength region. Emerging Imaging and Sensing Technologies for Security and Defence IX (pp 17-17), 16 September 2024 - 20 September 2024.
- Linear and Geiger-mode pseudo-planar Ge-on-Si avalanche photodiodes in the SWIR (Conference Presentation). Infrared Sensors, Devices, and Applications XIV (pp 12-12), 18 August 2024 - 23 August 2024.
- Extremely low noise InAs and AlGaAsSb avalanche photodiodes for low photon detection in infrared wavelengths. Optical Sensing and Detection VIII, Vol. 12999. Strasbourg, France, 7 April 2024 - 7 April 2024. View this article in WRRO
- Low photon detection using low-noise InAs and AlGaAsSb avalanche photodiodes. Infrared Technology and Applications L (pp 19-19), 21 April 2024 - 26 April 2024.
- Very high gain and low noise GaAsSb/AlGaAsSb avalanche photodiodes for 1550nm detection at room temperature. Optical Components and Materials XXI, Vol. 12882. San Francisco, California, United States, 27 January 2024 - 27 January 2024. View this article in WRRO
- Effect of biasing under illumination on GaAsBi/GaAs multiple quantum wells for solar cell performance. 2023 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (pp 40-43), 28 August 2023 - 30 August 2023.
- Avalanche multiplication and excess noise characteristics in antimony-based avalanche photodiodes. Emerging Imaging and Sensing Technologies for Security and Defence VII (pp 10-10), 5 September 2022 - 8 September 2022.
- Effect of bismuth flux on the optical and morphological properties of GaAsBi grown by Molecular Beam Epitaxy. 2022 IEEE 8th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) (pp 127-131), 26 September 2022 - 28 September 2022.
- GaAsBi light emitting diodes for 1050nm broadband light sources. Biomedical Spectroscopy, Microscopy, and Imaging II (pp 42-42), 3 April 2022 - 23 May 2022.
- Excess noise measurements in Al0.85Ga0.15As0.56Sb0.44 avalanche photodiodes. Optical Sensing and Detection VII (pp 7-7), 3 April 2022 - 16 May 2022.
- Comparison of the temperature dependence of impact ionization coefficients in AlAsSb, InAlAs, and InP. Optical Components and Materials XIX (pp 19-19), 22 January 2022 - 28 February 2022.
- Extremely low-noise avalanche photodiodes based on AlAs0.56Sb0.44. Emerging Imaging and Sensing Technologies for Security and Defence V; and Advanced Manufacturing Technologies for Micro- and Nanosystems in Security and Defence III (pp 18-18), 21 September 2020 - 25 September 2020.
- Photoluminescence and Raman Studies on $mathrm{GaAs}_{1-mathrm{x}}mathrm{Bi}_{mathrm{X}}$ Grown on GaAs. 2020 IEEE 8th International Conference on Photonics (ICP) (pp 1-2), 12 May 2020 - 30 June 2020.
- High-performance AlAs0.56Sb0.44 avalanche photodiodes (Conference Presentation). Optical Components and Materials XVII (pp 13-13), 1 February 2020 - 6 February 2020.
- Bandgap Engineering of GaAsBi Alloy for Emission of up to 1.52 µm. 2018 IEEE International Conference on Semiconductor Electronics (ICSE) (pp 177-179), 15 August 2018 - 17 August 2018.
- White Light Constrained Multi-Primary Modulation for Visible Light Communication. 2017 IEEE Globecom Workshops (GC Wkshps). Marina Bay Sands Expo and Convention Centre, Singapore, 4 December 2017 - 4 December 2017. View this article in WRRO
- Progress in low light-level InAs detectors- towards Geiger-mode detection. Proceedings, Advanced Photon Counting Techniques XI, Vol. 10212. California, United States, 9 April 2017 - 9 April 2017. View this article in WRRO
- CuZnS hole contacts on monocrystalline CdTe solar cells. 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (pp 3410-3412), 25 June 2017 - 30 June 2017.
- High sensitivity InAs photodiodes for mid-infrared detection. Proceedings of SPIE, Vol. 9988. Edinburgh View this article in WRRO
- GaAsBi: An Alternative to InGaAs Based Multiple Quantum Well Photovoltaics. Proceedings of the 43rd Photovoltaic Specialists Conference (PVSC) 2016 (pp 1135-1137). Portland, OR, USA, 5 June 2016 - 5 June 2016. View this article in WRRO
- Surface passivation of InAs avalanche photodiodes for low-noise infrared imaging. Photonics (ICP), 2016 IEEE 6th International Conference on. Sarawak, Malaysia, 14 March 2016 - 14 March 2016. View this article in WRRO
- Telecommunication wavelength GaAsBi light emitting diodes. IET Optoelectronics, Vol. 10(2) (pp 34-38) View this article in WRRO
- Al
0.52 In0.48 P photodetectors for underwater communication systems. Asia Communications and Photonics Conference, ACPC 2015
- The effect of growth conditions to the optical quality of GaAsBi alloy. 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) (pp 1-3), 19 August 2015 - 21 August 2015.
- Analysis of forward error correction schemes for colour shift keying modulation. 2015 IEEE 26th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications (PIMRC) (pp 575-579), 30 August 2015 - 2 September 2015.
- A high sensitivity detector for underwater communication systems. SPIE Proceedings, Vol. 9647 (pp 96470O-96470O)
- Higher Order Colour Shift Keying Modulation Formats for Visible Light Communications. 2015 IEEE 81st Vehicular Technology Conference (VTC Spring) (pp 1-5), 11 May 2015 - 14 May 2015.
- Al0.52In0.48P photodetectors for underwater communication systems. Asia Communications and Photonics Conference 2015 (pp ASu5A.3-ASu5A.3), 2015.
- Low breakdown voltage CMOS compatible p-n junction avalanche photodiode. 2014 IEEE Photonics Conference (pp 170-171), 12 October 2014 - 16 October 2014.
- InAsBi photodiode operating in the MWIR. 2014 IEEE Photonics Conference (pp 356-357), 12 October 2014 - 16 October 2014.
- Narrow-band detector for underwater communication system. 2014 IEEE Photonics Conference (pp 346-347), 12 October 2014 - 16 October 2014.
- Demonstration of an InAsBi photodiode operating in the MWIR. SPIE Proceedings
- Photoluminescence from localized states in GaAsBi epilayers. 2014 IEEE International Conference on Semiconductor Electronics (ICSE2014) (pp 354-357), 27 August 2014 - 29 August 2014.
- A low noise op-amp transimpedance amplifier for LIDAR applications. 2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS) (pp 590-593), 7 December 2014 - 10 December 2014.
- High speed low noise InAs electron avalanche photodiodes for telecommunication and infrared sensing applications. 4th International Conference on Photonics Icp 2013 Conference Proceeding (pp 78-80)
- Design of High Sensitivity Detector for Underwater Communication System. EMERGING TECHNOLOGIES IN SECURITY AND DEFENCE; AND QUANTUM SECURITY II; AND UNMANNED SENSOR SYSTEMS X, Vol. 8899
- Uncooled MWIR InAs/GaSb type-II superlattice grown on a GaAs substrate. EMERGING TECHNOLOGIES IN SECURITY AND DEFENCE; AND QUANTUM SECURITY II; AND UNMANNED SENSOR SYSTEMS X, Vol. 8899
- Performance evaluation of IEEE 802.15.7 CSK physical layer. Globecom Workshops (GC Wkshps), 2013 IEEE
- InAs quantum dot photodetector operating at 1.3 µm grown on Silicon. IEEE Photonics Conference 2012 (pp 167-168), 23 September 2012 - 27 September 2012.
- InAs electron avalanche photodiodes with 580 GHz gain-bandwidth product. Technical Digest 2012 17th Opto Electronics and Communications Conference Oecc 2012 (pp 220-221)
- Dilute nitride GaInNAs and GaInNAsSb for solar cell applications. Proceedings of SPIE the International Society for Optical Engineering, Vol. 8256
- GaAs p-i-n diodes for room temperature soft X-ray photon counting. IEEE Nuclear Science Symposium Conference Record (pp 4809-4811)
- High detectivity MWIR type-II superlattice grown on a GaAs substrate. IEEE Photonic Society 24th Annual Meeting Pho 2011 (pp 31-32)
- InAs Electron-Avalanche Photodiodes: From leaky diodes to extremely low noise avalanche photodiodes. IEEE Photonic Society 24th Annual Meeting (pp 276-277), 9 October 2011 - 13 October 2011.
- Avalanche gain distribution of X-ray avalanche photodiodes. IEEE Nuclear Science Symposium Conference Record (pp 2238-2241)
- InAs avalanche photodiodes for X-ray detection. IEEE Nuclear Science Symposium Conference Record (pp 2071-2073)
- Development of AlGaAs avalanche diodes for soft X-ray photon counting. IEEE Nuclear Science Symposium Conference Record (pp 4528-4531)
- High detectivity MWIR type-II superlattice grown on a GaAs substrate. IEEE Photonic Society 24th Annual Meeting, PHO 2011 (pp 31-32)
- InGaAsN absorber for telecommunication wavelength APDs. 2010 Photonics Global Conference Pgc 2010
- Spectrally tunable quantum dot infrared detectors: Implementation of an algorithm-based spectrometer. 2010 23rd Annual Meeting of the IEEE Photonics Society Photinics 2010 (pp 706-707)
- Sensitivity of high-speed receivers using InAlAs avalanche photodiodes. 2010 23rd Annual Meeting of the IEEE Photonics Society Photinics 2010 (pp 126-127)
- Dry etching and surface passivation techniques for type-II InAs/GaSb superlattice infrared detectors. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7838
- InGaAsN as absorber in APDs for 1.3 micron wavelength applications. Conference Proceedings International Conference on Indium Phosphide and Related Materials (pp 187-190)
- Low excess noise APD with detection capabilities above 2 microns. Conference Proceedings International Conference on Indium Phosphide and Related Materials (pp 421-424)
- High gain InAs electron-avalanche photodiodes for optical communication. Conference Proceedings International Conference on Indium Phosphide and Related Materials (pp 409-412)
- Reduction of dark current and unintentional background doping in InGaAsN photodetectors by ex situ annealing. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7726
- Quantum dot infrared photodetectors with highly tunable spectral response for an algorithm based spectrometer. INFRARED TECHNOLOGY AND APPLICATIONS XXXVI, PTS 1 AND 2, Vol. 7660
- Simulations of avalanche breakdown statistics: Probability and timing. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7681
- Characterisation of Low Noise 4H-SiC Avalanche Photodiodes. SILICON CARBIDE AND RELATED MATERIALS 2009, PTS 1 AND 2, Vol. 645-648 (pp 1081-1084)
- Dark current mechanisms in InxGa1-xAs1-yNy. 2009 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1AND 2 (pp 233-234)
- Low Strain Multiple Stack Quantum Dot Infrared Photodetectors for Multispectral and High Resolution Hyperspectral Imaging. 2009 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1AND 2 (pp 166-167)
- Type-II photodiode and APD for detection in the 2-2.5 mu m wavelength range. 2009 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1AND 2 (pp 293-294)
- The development of extremely low noise InAs electron APDs for photon counting applications in SWIR/MWIR wavelengths. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7355
- InAlAs avalanche photodiode with type-II absorber for detection beyond 2 μm. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7298
- The development of extremely low noise InAs electron APDs for SWIR active or passive imaging. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7298
- Avalanche Photodiodes beyond 1.65μm. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7320
- Temperature Dependence of Hole Impact Ionization Coefficient in 4H-SiC Photodiodes. SILICON CARBIDE AND RELATED MATERIALS 2008, Vol. 615-617 (pp 311-314)
- The development of extremely low noise InAs electron APDs for photon counting applications in SWIR/MWIR wavelengths. PHOTON COUNTING APPLICATIONS, QUANTUM OPTICS, AND QUANTUM INFORMATION TRANSFER AND PROCESSING II, Vol. 7355
- Extended Wavelength Avalanche Photodiodes. 2009 4TH INTERNATIONAL CONFERENCE ON COMPUTERS AND DEVICES FOR COMMUNICATION (CODEC 2009) (pp 454-457)
- Potential Materials for Avalanche Photodiodes Operating above 10Gb/s. 2009 4TH INTERNATIONAL CONFERENCE ON COMPUTERS AND DEVICES FOR COMMUNICATION (CODEC 2009) (pp 442-447)
- Avalanche Multiplication and Impact Ionisation in Separate Absorption and Multiplication 4H-SiC Avalanche Photodiodes. SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, Vol. 600-603 (pp 1207-1210)
- InAs electron avalanche photodiodes with single carrier type multiplication and extremely low excess noise. Conference Proceedings Lasers and Electro Optics Society Annual Meeting LEOS (pp 296-297)
- OPTIMIZATION OF InP APDs FOR HIGH-SPEED LIGHTWAVE SYSTEMS. 2008 IEEE 20TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS (IPRM) (pp 319-322)
- DESIGN CONSIDERATIONS FOR IN(0.52)AL(0.48)AS BASED AVALANCHE PHOTODIODES. 2008 IEEE 20TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS (IPRM) (pp 331-333)
- DARK CURRENT MECHANISMS IN BULK GaInNAs PHOTODIODES. 2008 IEEE 20TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS (IPRM) (pp 345-348)
- Low noise avalanche photodiodes. 2008 IEEE International Conference on Semiconductor Electronics (pp A12-A12), 25 November 2008 - 27 November 2008.
- Infrared photodiodes based on Type-II strained layer superlattices. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7113
- Low noise InAs avalanche photodiodes for high sensitivity FPAs. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7113
- Multiple stack quantum dot infrared photodetectors. Proceedings of SPIE the International Society for Optical Engineering, Vol. 7113
- Effects of spacer growth temperature on the optical properties of quantum dot laser structures - art. no. 68000U. DEVICE AND PROCESS TECHNOLOGIES FOR MICROELECTRONICS, MEMS, PHOTONICS AND NANOTECHNOLOGY IV, Vol. 6800 (pp U8000-U8000)
- Impact ionization of sub-micron InP structures. 2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 515-516)
- Temperature dependence of breakdown voltage of InP and InAlAs avalanche photodiodes. 2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 513-514)
- Fabrication of InAs Photodiodes with reduced surface leakage current - art. no. 67400H. OPTICAL MATERIALS IN DEFENCE SYSTEMS TECHNOLOGY IV, Vol. 6740 (pp H7400-H7400)
- The effects of monolayer thickness and sheet doping density on dark current and noise current in Quantum Dot Infrared Photodetectors - art. no. 67400J. OPTICAL MATERIALS IN DEFENCE SYSTEMS TECHNOLOGY IV, Vol. 6740 (pp J7400-J7400)
- Extremely low excess noise InAlAs avalanche photodiodes. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 81-83)
- Temperature dependence of inp-based avalanche photodiodes. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 296-298)
- InP-based avalanche photodiodes with > 2.1 mu m detection capability. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 293-295)
- Gainnas lattice-matched to GaAs for photodiodes. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 347-349)
- Determination of impact ionization coefficients measured from 4H-silicon carbide avalanche photodiodes. Silicon Carbide and Related Materials 2006, Vol. 556-557 (pp 339-342)
- Optimisation of quantum dot infrared photodetectors (QDIPs) for imaging applications. Electro-Optical and Infrared Systems: Technology and Applications III, Vol. 6395 (pp U102-U110)
- Multiplication and excess noise of avalanche photodiodes with InGaAs absorption layer. IEE P-OPTOELECTRON, Vol. 153(4) (pp 191-194)
- Design, fabrication and characterisation of InGaAs/InP single-photon avalanche diode detectors. Optics Infobase Conference Papers
- Excess noise and avalanche multiplication in InAlAs. 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2 (pp 787-788)
- A comparison of the lower limit of multiplication noise in InP and InAlAs based APDs for telecommunications receiver applications. 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2 (pp 789-790)
- Avalanche noise in In0.53Ga0.44As avalanching regions. 2005 International Conference on Indium Phosphide and Related Materials (pp 428-431)
- Low noise avalanche photodiodes. 2005 IEEE LEOS Annual Meeting Conference Proceedings (LEOS) (pp 368-369)
- Optimizing the growth of 1.3-mu m InAs/InGaAs dots-in-a-well structure: Achievement of high-performance laser. MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, Vol. 25(5-8) (pp 779-783)
- A comparison of avalanche breakdown probabilities in semiconductor materials. JOURNAL OF MODERN OPTICS, Vol. 51(9-10) (pp 1315-1321)
- Low noise GaAs-based avalanche photodiodes for long wavelength applications. Device Research Conference Conference Digest Drc (pp 79-80)
- Improvement in the optical quality of GaInNAs/GaInAs quantum well structures by interfacial strain reduction. IEE PROCEEDINGS-OPTOELECTRONICS, Vol. 151(5) (pp 301-304)
- Investigations of 1.55-mu m GaInNAs/GaAs heterostructures by optical spectroscopy. IEE PROCEEDINGS-OPTOELECTRONICS, Vol. 151(5) (pp 331-334)
- Avalanche multiplication and breakdown in 4H-SiC diodes. SILICON CARBIDE AND RELATED MATERIALS 2003, PTS 1 AND 2, Vol. 457-460 (pp 1069-1072)
- Lonisation dead space and the super-APD. 2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 995-996)
- Theoretical study of breakdown probabilities in single photon avalanche diodes. 2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 773-774)
- Effect of temperature on the avalanche properties of sub-micron structures. COMPOUND SEMICONDUCTORS 2002, Vol. 174 (pp 263-266)
- High gain, low noise 4H-SiC UV avalanche photodiodes. COMPOUND SEMICONDUCTORS 2002, Vol. 174 (pp 355-358)
- In0.53Ga0.47As ionization coefficients deduced from photomultiplication measurements. COMPOUND SEMICONDUCTORS 2002, Vol. 174 (pp 267-270)
- Physics & design of low noise avalanche photodiodes. CAOL '2003: PROCEEDINGS OF THE 1ST INTERNATIONAL CONFERENCE ON ADVANCED OPTOELECTRONICS AND LASERS, VOL 1 (pp 99-99)
- Physics and design of low noise avalanche photodiodes - LEOS distinguished lecture 2003-2004. ICTON 2003: 5TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, VOL 2, PROCEEDINGS (pp 170-170)
- Low Noise Avalanche Photodiodes. Optics Infobase Conference Papers (pp 19-20)
- Temperature dependence of avalanche multiplication in GaAs. EDMO 2002: 10TH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 226-230)
- Temperature dependence of In0.53Ga0.47As ionisation coefficients. EDMO 2002: 10TH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 316-320)
- Impact ionisation coefficients of In0.53Ga0.47As. IEE P-OPTOELECTRON, Vol. 148(5-6) (pp 225-228)
- Design considerations for high-speed low-noise avalanche photodiodes. DESIGN, FABRICATION, AND CHARACTERIZATION OF PHOTONIC DEVICES II, Vol. 4594 (pp 1-9)
- How avalanche pulses evolve in space and time. PHYSICS AND SIMULATION OF OPTOELECTRONIC DEVICES IX, Vol. 4283 (pp 511-518)
- Avalanche multiplication noise in bulk and thin AlxGa1-xAs (x=0-0.8) PIN and NIP diodes. PHOTODETECTORS: MATERIALS AND DEVICES VI, Vol. 4288 (pp 39-46)
- Photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, Vol. 224(2) (pp 497-502)
- GaN Schottky ultraviolet photodetectors using the metal-semiconductor-metal structure. EDMO 2001: INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 131-136)
- Photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots: Observation of a permanent dipole moment. SEMICONDUCTOR QUANTUM DOTS, Vol. 571 (pp 147-152)
- Low avalanche excess noise in thin AlxGa1-xAs (x=0.15 and 0.60) avalanche photodiodes. 2000 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS (pp 34-38)
- Low avalanche noise behaviour in bulk Al0.8Ga0.2As. 2001 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 519-523)
- Design of low-noise avalanche photodiodes. OPTOELECTRONIC INTEGRATED CIRCUITS IV, Vol. 3950 (pp 30-38)
- Avalanche multiplication and noise in sub-micron Si p-i-n diodes. SILICON-BASED OPTOELECTRONICS II, Vol. 3953 (pp 95-102)
- Avalanche multiplication and noise in sub-micron Si p-i-n diodes. Proceedings of SPIE the International Society for Optical Engineering, Vol. 3953 (pp 95-102)
- Photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots: observation of a permanent dipole moment. PHYSICA E, Vol. 7(3-4) (pp 408-412)
- Electric field gradient dependence of excess avalanche noise. Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications EDMO (pp 230-235)
- Avalanche multiplication in Al x Ga 1-x As/GaAs multilayer structures. SPIE Proceedings, Vol. 3896 (pp 385-385)
- Improved excess noise and temperature dependence of multiplication characteristics in thin InP avalanching regions. Conference Proceedings International Conference on Indium Phosphide and Related Materials (pp 295-298)
- Low noise avalanche photodetectors. Conference on Lasers and Electro Optics Europe Technical Digest (pp 383)
- Wide bandgap collectors in GaInP/GaAs heterojunction bipolar transistors with increased breakdown voltage. 1997 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 435-438)
- InGaAs/GaAs piezoelectric lasers. Conference on Lasers and Electro-Optics-Europe (pp CTuI50-CTuI50), 1998.
- Low Noise Avalanche Photodetectors. Conference on Lasers and Electro-Optics-Europe (pp CFG9-CFG9), 1998.
- Monte Carlo estimation of excess noise factor in thin p(+)-i-n(+) avalanche photodiodes. 1997 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 631-634)
- Avalanche multiplication in sub-micron AlxGa1-xAs/GaAs heterostructures. 1997 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 391-394)
- Wide bandgap collectors in GaInP/GaAs heterojunction bipolar transistors with increased breakdown voltage. COMPOUND SEMICONDUCTORS 1997, Vol. 156 (pp 435-438)
- Breakdown behaviour in wide bandgap collector GaInP/GaAs double heterojunction bipolar transistors. EDMO - 1997 WORKSHOP ON HIGH PERFORMANCE ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 273-278)
- Optical spectroscopic determination of the electronic band structure of bulk AlGaInP and GaInP-AlGaInP heterojunction band offsets. IN-PLANE SEMICONDUCTOR LASERS: FROM ULTRAVIOLET TO MIDINFRARED, Vol. 3001 (pp 135-146)
- <title>VCSELs for 640- to 1100-nm emission</title>. SPIE Proceedings, Vol. 3004 (pp 10-21)
- <title>Temperature effects in VCSELs</title>. SPIE Proceedings, Vol. 3003 (pp 100-110)
- Monte Carlo modelling of impact ionisation in GaAs. COMPOUND SEMICONDUCTORS 1996(155) (pp 629-632)
- Monte Carlo simulation of impact ionization effects in MSM photodetectors and MESFET's.. COMPOUND SEMICONDUCTORS 1996(155) (pp 659-662)
- All-optical modulation near 1.55 mu m using In1-x-yGaxAlyAs coupled quantum wells. COMPOUND SEMICONDUCTORS 1996(155) (pp 539-542)
- Impact ionisation and temperature dependence of breakdown in Ga0.52In0.48P. COMPOUND SEMICONDUCTORS 1996(155) (pp 585-588)
- Incorporation of As-2 in InAsxP1-x and its application to InAsxP1-x/InP quantum well structures. JOURNAL OF CRYSTAL GROWTH, Vol. 175 (pp 1033-1038)
- Avalanche photodiode (APD) noise dependence on avalanche region width. 55TH ANNUAL DEVICE RESEARCH CONFERENCE, DIGEST - 1997 (pp 170-171)
- Impact ionisation coefficients in (AlxGa1-x)(0.52)In0.48P. COMPOUND SEMICONDUCTORS 1995, Vol. 145 (pp 569-574)
- Breakdown characteristics of (AlXGa1-X)(0.52)In0.48P p-i-n diodes. ICSE '96 - 1996 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS (pp 256-260)
- Electron and hole multiplication characteristics in short GaAs PINs. COMPOUND SEMICONDUCTORS 1995, Vol. 145 (pp 563-568)
- Multiplication characteristics of thin AlxGa1-xAs (x=0 to 0.3) diodes. 1996 54TH ANNUAL DEVICE RESEARCH CONFERENCE DIGEST (pp 44-45)
- Non-local effects on the multiplication characteristics of thin GaAs p-i-n and n-i-p diodes. 1995 WORKSHOP ON HIGH PERFORMANCE ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (EDMO) (pp 64-69)
- Exciton effects in strain-balanced GaInAs/AlInAs and GaInAs/GaInAs coupled quantum wells.. NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, Vol. 17(11-12) (pp 1607-1612)
- Photoluminescence of piezoelectric strained InGaAs-GaAs multi-quantum well p-i-n structures. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, Vol. 35(1-3) (pp 42-46)
- Visible vertical cavity surface emitting lasers at lambda<650 nm. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, Vol. 35(1-3) (pp 12-16)
- InxGa1-xAs/InP multiquantum well structures grown on [111]B InP substrates. SEVENTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS, CONFERENCE PROCEEDINGS (pp 299-302)
- Demonstration of All-Optical Bistability in a Strained Piezoelectric Self Electro-optic Effect Device. Integrated Photonics Research (pp FF5-FF5), 1994.
- LEAKAGE CURRENT MECHANISMS IN STRAINED INGAAS/GAAS MQW STRUCTURES. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1993, Vol. 136(136) (pp 373-378)
- AVALANCHE BREAKDOWN IN GAAS/ALXGA1-XAS MULTILAYERS AND ALLOYS. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1993, Vol. 136(136) (pp 721-726)
- OPTOELECTRONIC EFFECTS AND FIELD DISTRIBUTION IN STRAINED (111)B INGAAS/ALGAAS MQW PIN DIODES. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1993, Vol. 136(136) (pp 331-336)
- REVERSE BREAKDOWN CHARACTERISTICS IN INGA(AL)P INGAP P-I-N JUNCTIONS. SIXTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS: CONFERENCE PROCEEDINGS (pp 403-406)
- GROWTH AND CHARACTERIZATION OF HIGH-QUALITY GAINP/ALGAINP QUANTUM-WELLS BY SOLID-SOURCE MOLECULAR-BEAM EPITAXY. SIXTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS: CONFERENCE PROCEEDINGS (pp 551-554)
- SPECTROSCOPIC STUDY OF PIEZOELECTRIC FIELD EFFECTS IN INGAAS/GAAS MULTIQUANTUM WELLS GROWN ON (111)B ORIENTED GAAS SUBSTRATES. SOLID-STATE ELECTRONICS, Vol. 37(4-6) (pp 645-648)
- Demonstration of All-Optical Bistability in a Strained Piezoelectric Self Electro-optic Effect Device. Optics Infobase Conference Papers (pp 260-262)
- DEVICES AND DESIRES IN THE 2-4 MU-M REGION BASED ON ANTIMONY-CONTAINING III-V HETEROSTRUCTURES GROWN BY MOVPE. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, Vol. 8(1) (pp S380-S385)
- QUANTUM-CONFINED STARK-EFFECT IN INGAAS/INP MULTIPLE QUANTUM-WELLS GROWN BY SOLID SOURCE MOLECULAR-BEAM EPITAXY. JOURNAL OF CRYSTAL GROWTH, Vol. 111(1-4) (pp 1080-1083)
- DISORDERING OF IN0.53GA0.47AS/INP MULTIPLE QUANTUM-WELLS BY SULFUR OR ZINC DIFFUSION AND PROTON-BOMBARDMENT. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1988 (pp 397-400)
- Influence of Growth Conditions on the Structural and Opto-electronic Quality of GaAsBi. Journal of Crystal Growth. Montpellier, France View this article in WRRO
- Determination of Impact Ionization Coefficients Measured from 4H Silicon Carbide Avalanche Photodiodes (pp 339-342)
- Physics and design of low noise avalanche photodiodes. Proceedings of CAOL'2003. 1st International Conference on Advanced Optoelectronics and Lasers. Jontly with 1st Workshop on Precision Oscillations in Electronics and Optics (IEEE Cat. No.03EX715), Vol. 1 (pp 99-99)
- Temperature dependence of avalanche breakdown in GaAs p-i-n diodes. HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372) (pp 187-190)
- A 25 period InAs/sub 0.54/P/sub 0.46//In/sub 0.89/Ga/sub 0.11/P MQW for 1.55 μm modulation grown by solid source MBE. Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials (Cat. No.98CH36129) (pp 564-567)
- InAsP/In[Ga]P MQWs for 1.55 μm modulators grown by solid-source MBE. Conference Proceedings. 1997 International Conference on Indium Phosphide and Related Materials (pp 440-443)
- Strain effects in InAsP/InP MQW modulators for 1.06 μm operation. Seventh International Conference on Indium Phosphide and Related Materials (pp 536-539)
- Varying strains in InAs/sub 1-x/P/sub x//InP multiple quantum well device structures. 1993 (5th) International Conference on Indium Phosphide and Related Materials (pp 652-655)
- Photoconductivity of a strained InAs/InP superlattice in the 1.0-1.5 mu m region. LEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels (pp 569-572)
- High quality pseudomorphic InAs/InP quantum wells grown by molecular beam epitaxy. [Proceedings 1991] Third International Conference Indium Phosphide and Related Materials (pp 492-495)
Preprints
- Low Excess Noise, High Quantum Efficiency Avalanche Photodiodes for Beyond 2 {mu}m Wavelength Detection, arXiv.
- Multi-Dimensional Optimization of In0.53Ga0.47As Thermophotovoltaic Cell using Real Coded Genetic Algorithm, Research Square Platform LLC.
- Performance Evaluation of Frequency Domain Equalisation Based Colour Shift Keying Modulation Schemes Over Diffuse Optical Wireless Channels, arXiv.
- Design, fabrication and characterisation of InGaAs/InP single-photon avalanche diode detectors, arXiv.
- Design and Performance of an InGaAs-InP Single-Photon Avalanche Diode Detector, arXiv.
- Capacitance-voltage characterization of GaAsBi/GaAs multiple quantum wells grown by molecular beam epitaxy. Journal of Physics: Conference Series, 3020. View this article in WRRO
- Research group
-
Materials and Devices
- Teaching interests
-
- EEE124 -Introduction to Energy
- EEE225 - Analogue and Digital Electronics
- EEE6216 -Energy Efficient Semiconductor Devices
- MEC316 - Renewable Energy
- Professional activities and memberships
-
- Fellow of the IEEE
- Fellow of the IET