Transmission Electron Microscopy



Multipurpose field emission transmission electron microscope with high spatial resolution and improved analytical performance. 

Photo of  JEM-F200 (JEOL)


The F200 is capable of high sensitivity and resolution materials analysis. 


The JEOL JEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread, supporting high energy resolution electron energy loss spectroscopy (EELS). Dual Silicon Drift Detectors (SDD) enable high sensitivity and throughput X-ray analysis. 

The F200 features:

  • A quad lens condenser system to independently control intensity and convergence angle,
  • The SpecPorter automated sample holder transfer system,
  • A PicoStage to carry out precise sample movements, and
  • A GATAN OneView camera to provide 16 megapixel imaging and video capabilities for TEM. 


  • Accelerating voltages of 200 and 80kV
  • Improved Cold FEG with narrow energy spread
  • Quad lens condenser system
  • SpecPorter automated sample holder transfer system
  • GATAN OneView camera
  • Dual Silicon Drift Detectors
  • GATAN Quantum GIF
  • TEM/STEM Tomography holder

Sorby Centre for Electron Microscopy, The University of Sheffield North Campus, Kroto Research Institute, Broad Lane, Sheffield, S3 7HQ


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