Transmission Electron Microscopy
JEOL JEM-F200
Multipurpose field emission transmission electron microscope with high spatial resolution and improved analytical performance.
USES/APPLICATIONS
The F200 is capable of high sensitivity and resolution materials analysis.
DETAILED DESCRIPTION
The JEOL JEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread, supporting high energy resolution electron energy loss spectroscopy (EELS). Dual Silicon Drift Detectors (SDD) enable high sensitivity and throughput X-ray analysis.
The F200 features:
- A quad lens condenser system to independently control intensity and convergence angle,
- The SpecPorter automated sample holder transfer system,
- A PicoStage to carry out precise sample movements, and
- A GATAN OneView camera to provide 16 megapixel imaging and video capabilities for TEM.
DETAILED SPECIFICATIONS
- Accelerating voltages of 200 and 80kV
- Improved Cold FEG with narrow energy spread
- Quad lens condenser system
- SpecPorter automated sample holder transfer system
- GATAN OneView camera
- Dual Silicon Drift Detectors
- GATAN Quantum GIF
- TEM/STEM Tomography holder
LOCATION
Sorby Centre for Electron Microscopy, The University of Sheffield North Campus, Kroto Research Institute, Broad Lane, Sheffield, S3 7HQ
ENQUIRE HERE: royce@sheffield.ac.uk